We describe recent work at NIST to develop compact, low-power instruments based on a combination of precision atomic spectroscopy, advanced diode lasers and microelectromechanical systems (MEMS). Designed to be fabricated in parallel in large numbers, these "chip-scale" atomic devices may eventually impact a wide range of applications, from the global positioning system to magnetic resonance imaging and inertial navigation.
Proceedings Title: Proc. 2008 Symposium on Frequency Standards and Metrology
Conference Dates: December 1-4, 2008
Conference Location: Pacific Grove, CO
Pub Type: Conferences
chip-scale atomic device, atomic clock, magnetometer, gyroscope, microelectromachanical systems