Chip-scale atomic devices: precision atomic instruments based on MEMS
John E. Kitching, Svenja A. Knappe, Vladislav Gerginov, Vishal Shah, Peter D. Schwindt, Brad Lindseth, Elizabeth A. Donley, Ying-ju Wang, Eleanor Hodby, Matt Eardley, Ricardo Jimenez Martinez, William C. Griffith, Andrew Geraci, Jan Preusser, Tara C. Liebisch, Hugh Robinson, Leo Hollberg
We describe recent work at NIST to develop compact, low-power instruments based on a combination of precision atomic spectroscopy, advanced diode lasers and microelectromechanical systems (MEMS). Designed to be fabricated in parallel in large numbers, these "chip-scale" atomic devices may eventually impact a wide range of applications, from the global positioning system to magnetic resonance imaging and inertial navigation.
Proc. 2008 Symposium on Frequency Standards and Metrology