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Robustness of display hemispherical reflectance measurement apparatus
Published
Author(s)
John Penczek, Edward F. Kelley, Seugkwan Kim
Abstract
Reflection measurements are critical to the evaluation of display performance under ambient illumination conditions. Various hemispherical reflection methods are evaluated for their suitability and robustness across display technologies. The standard integrating sphere method is compared to a sampling sphere apparatus.
Proceedings Title
Proceedings of 8th International Meeting on Information Display, Oct. 13-17, 2008
Penczek, J.
, Kelley, E.
and Kim, S.
(2008),
Robustness of display hemispherical reflectance measurement apparatus, Proceedings of 8th International Meeting on Information Display, Oct. 13-17, 2008, Ilsan, -1, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=33184
(Accessed October 10, 2025)