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PUBLICATIONS

Robustness of display hemispherical reflectance measurement apparatus

Published

Author(s)

John Penczek, Edward F. Kelley, Seugkwan Kim

Abstract

Reflection measurements are critical to the evaluation of display performance under ambient illumination conditions. Various hemispherical reflection methods are evaluated for their suitability and robustness across display technologies. The standard integrating sphere method is compared to a sampling sphere apparatus.
Proceedings Title
Proceedings of 8th International Meeting on Information Display, Oct. 13-17, 2008
Conference Dates
October 13-17, 2008
Conference Location
Ilsan
Pub Type
Conferences

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Keywords

diffuse reflectance, display refraction measurements, display measurements, integrating sphere, sampling sphere
Optoelectronics

Citation

Penczek, J. , Kelley, E. and Kim, S. (2008), Robustness of display hemispherical reflectance measurement apparatus, Proceedings of 8th International Meeting on Information Display, Oct. 13-17, 2008, Ilsan, -1, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=33184 (Accessed May 1, 2024)

Created October 1, 2008, Updated February 19, 2017