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Conferences

Dual-CGH Interferometry Test for X-Ray Mirror Mandrels

Author(s)
Guangjun Gao, John Lehan, Ulf Griesmann
We describe a glancing-incidence interferometric double-pass test, based on a pair of computer generated holograms (CGHs), for mandrels used to fabricate x-ray

Design of a Turn-Key 10 V Programmable Josephson Voltage Standard System

Author(s)
Paul D. Dresselhaus, Mike Elsbury, Charles J. Burroughs, David I. Olaya, Samuel P. Benz, Norman F. Bergren, Robert E. Schwall, Zoya Popovic
NIST is designing a 10 V Programmable Josephson Voltage Standard (PJVS) system with an improved microwave design and arrays of stacked NbXSi1-x-barrier

Modeling and Simulation for Sustainable Manufacturing

Author(s)
Deogratias Kibira, Charles R. McLean
With increasing frequency the news media reports that the planet is warming, pollutants are contaminating the environment, energy costs are rising, and precious

Understanding EuP and REACH

Author(s)
John V. Messina, Eric D. Simmon
There has been a world-wide trend towards legislation meant to encourage sustainable manufacturing and minimize the environmental impact of product

Improvements in the NIST Johnson Noise Thermometry System

Author(s)
Samuel Benz, Horst Rogalla, Rod White, Jifeng Qu, Paul Dresselhaus, Wes L. Tew, Sae Woo Nam
We have developed a Johnson noise thermometry system that is calibrated by precision waveforms synthesized with a quantum-accurate voltage noise source (QVNS)

Complete waveform characterization at NIST

Author(s)
Paul D. Hale, Tracy S. Clement, Darryl A. Keenan, Dylan F. Williams, Arkadiusz C. Lewandowski, C. M. Wang, Andrew Dienstfrey
We present a method for calibrating the voltage a pulse generator delivers to a load at every point in the measured waveform epoch. The calibration includes an

Calibrated Broadband Electrical Characterization of Nanowires

Author(s)
Thomas Mitchell (Mitch) Wallis, Atif A. Imtiaz, Hans Nembach, Kristine A. Bertness, Norman Sanford, Paul T. Blanchard, Pavel Kabos
A technique is presented for the broadband electrical characterization of nanowires. The technique relies on established on-wafer calibration methods as well as
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