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Hae-Jeong Lee, Marvi Matos, Lisa Pakstis, Marcus T. Cicerone, Joy Dunkers
There is considerable interest in how cells respond to mechanical stimuli, from the ligands used to transmit the stimulus to the signaling pathways initiated to
Statistical analysis of key comparison and inter-laboratory experiments is required to produce an estimate of the measurand called a reference value and further
Swee K. Leong, Marcus Johansson, Bj?rn Johansson, Yung-Tsun T. Lee, Frank H. Riddick
While software for discrete event simulation (DES) has emerged into sophisticated tools for decision support in a wide range of contexts, the need to integrate
M J. Ferreira, S M. Strege, Richard Peacock, Jason D. Averill
This paper examines smoke control and occupant evacuation in WTC 1 and WTC 2 on September 11, 2001focusing on the impact region and above for each tower
In this work we present a brief review of recent results for water line shapes obtained by means of the frequency stabilized cavity ring-down spectroscopy (FS
Jason P. Campbell, Kin P. Cheung, John S. Suehle, A Oates
We utilize fast-IdVg measurements to examine NBTI recovery over a time scale of 2usecs to 1000 seconds. The extracted DVTH and %GM degradation data clearly
The third PASCAL Recognizing Textual Entailment Challenge (RTE-3) contained an optional task that extended the main entailment task by requiring a system to
This paper characterizes nonlinear distortion in an analog-to-digital converter (ADC) when it is excited by representative communication signals having non
We describe a glancing-incidence interferometric double-pass test, based on a pair of computer generated holograms (CGHs), for mandrels used to fabricate x-ray
Jose M. Ortiz, Madelaine H. Hernandez, Tam H. Duong, Scott G. Leslie, Allen R. Hefner Jr.
The DARPA WBGS-HPE program is developing 100 A, 10 kV SiC power modules to demonstrate the viability of a 2.75 MVA Solid State Power Substation that uses 10 kV
Paul D. Dresselhaus, Mike Elsbury, Charles J. Burroughs, David I. Olaya, Samuel P. Benz, Norman F. Bergren, Robert E. Schwall, Zoya Popovic
NIST is designing a 10 V Programmable Josephson Voltage Standard (PJVS) system with an improved microwave design and arrays of stacked NbXSi1-x-barrier
Tam H. Duong, Jose M. Ortiz, R. N. Raju, Allen R. Hefner Jr.
This paper presents the results from a parametric simulation study that was conducted to optimize the performance of 100 A, 10 kV, 20 kHz half-bridge SiC MOSFET
Static Analysis Workshop (SAW 2008) was held on June 12, 2008 in Tucson, Arizona and was co-located with ACM SIGPLAN 2008 Conference on Programming Language
Jeffrey T. Fong, James J. Filliben, Nathanael A. Heckert, Roland deWit
A fundamental mathematical modeling and computational tool in engineering and applied sciences is the finite element method (FEM). The formulation of every such
With increasing frequency the news media reports that the planet is warming, pollutants are contaminating the environment, energy costs are rising, and precious
The properties of both insulators and metals can be characterized capacitively with scanning probe microscopy, though the techniques employed are different
Heather J. Patrick, Thomas A. Germer, Michael W. Cresswell, Bin Li, Huai Huang, Paul S. Ho
The extraction of nanoscale dimensions and feature geometry of grating targets using signature-based optical techniques is an area of continued interest in
Alain Rufenacht, Charles J. Burroughs, Samuel P. Benz, Paul D. Dresselhaus, Bryan C. Waltrip, Thomas L. Nelson
Sampling is a promising technique to compare the stepwise-approximated sine waves synthesized by an AC Programmable Josephson Voltage Standard to the sinusoidal
Michael A. Lewis, Ryan P. Taylor, Peter E. Bradley, Isaac Garaway, Ray Radebaugh
A single-stage pulse tube cryocooler was designed to provide rapid cooldown of a high temperature superconducting (HTS) magnet that is part of a gyrotron
Samuel Benz, Paul Dresselhaus, Norman F. Bergren, Regis Landim
We present a new record output voltage of 275 mVrms, which is a 25% improvement over the maximum achieved with previous ac Josephson voltage standard circuits
Samuel Benz, Horst Rogalla, Rod White, Jifeng Qu, Paul Dresselhaus, Wes L. Tew, Sae Woo Nam
We have developed a Johnson noise thermometry system that is calibrated by precision waveforms synthesized with a quantum-accurate voltage noise source (QVNS)
A brief summary is presented for the uncertainty analysis for measurements of noise parameters of amplifiers and transistors, in both connectorized (coaxial)
The design and evaluation of a WR-15 (50 to 75 GHz) rectangular waveguide microcalorimeter is presented. This new microcalorimeter will be the national standard
Michael H. Francis, Ronald C. Wittmann, Randy Direen
Although the theory is straightforward, practical implementation of spherical near-field scanning for evaluating test chambers presents some significant
Ian R. Coddington, William C. Swann, Nathan R. Newbury
The output of a femtosecond fiber laser can be both spectrally broadened and stabilized, thereby providing a broadband coherent source in the near infrared. In
Paul D. Hale, Tracy S. Clement, Darryl A. Keenan, Dylan F. Williams, Arkadiusz C. Lewandowski, C. M. Wang, Andrew Dienstfrey
We present a method for calibrating the voltage a pulse generator delivers to a load at every point in the measured waveform epoch. The calibration includes an
Steven P. Mates, Richard L. Rhorer, Stephen W. Banovic, Eric P. Whitenton, Richard J. Fields
The tensile strength of frangible bullets is measured by a high rate diametral compression test (DCT) performed with a Kolsky Bar. Frangible bullets, meant to
James R. Baker-Jarvis, Michael D. Janezic, Billy F. Riddle
The concepts of effective permittivity and permeability are used throughout the literature to describe both highly heterogeneous materials, inhomogeneous
Thomas Mitchell (Mitch) Wallis, Atif A. Imtiaz, Hans Nembach, Kristine A. Bertness, Norman Sanford, Paul T. Blanchard, Pavel Kabos
A technique is presented for the broadband electrical characterization of nanowires. The technique relies on established on-wafer calibration methods as well as