Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

A Direct Josephson Voltage Standard  Comparison between NIST and Lockheed Martin Mission Service

Published

Author(s)

Yi-hua Tang

Abstract

A direct Josephson Voltage Standard (JVS) comparison between NIST and Lockheed Martin Mission Services (LMMS) is carried out in March 2008 by using the NIST compact JVS (CJVS) to support the 8th JVS Interlaboratory Comparison (ILC) in 2008, sponsored by the National Conference of Standard Laboratories International (NCSLI). LMMS is the pilot laboratory for JVS ILC 2008. A comparison between NIST and LMMS provides all the JVS ILC participating laboratories a link to NIST. A protocol designed for the JVS direct comparison is described in the paper. It is possible to carry out a direct JVS comparison for detecting JVS system errors related to the frequency measurement, cryoprobe leakage and Josephson junction array performance which are normally not detectable by other means of JVS comparison, such as Zener Measurement Assurance Program (MAP). The difference between the LMMS JVS and the NIST CJVS at 10 V was found to be -0.8 nV with an expanded uncertainty of 6.9 nV (k = 2) or relative uncertainty of 6.9 parts in 10^10. The comparison has confirmed that LMMS JVS is well set up as the pivot lab for the NCSLI JVS ILC 2008.
Proceedings Title
NCSL International Workshop and Symposium
Conference Dates
August 3-7, 2008
Conference Location
Orlando, FL

Keywords

Compact Josephson voltage standard (CJVS), direct JVS comparison, interlaboratory comparison (ILC), uncertainty

Citation

Tang, Y. (2008), A Direct Josephson Voltage Standard  Comparison between NIST and Lockheed Martin Mission Service, NCSL International Workshop and Symposium, Orlando, FL, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=33003 (Accessed July 23, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created August 1, 2008, Updated February 17, 2017