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Conferences

Noise-parameter measurement with automated variable terminations

June 8, 2008

Author(s)

Dazhen Gu, Dave K. Walker, James P. Randa

NIST has upgraded its measurement capability of noise parameters on low-noise amplifiers with a variable termination unit in the 1 to 12.4 GHz range. Such a

Bilateral optical fiber power meter linearity comparison between NMIJ and NIST

June 8, 2008

Author(s)

Seiji Mukai, Kuniaki Amemiya, Michiyuki Endo, Igor Vayshenker, Xiaoyu X. Li, Shao Yang

Optical fiber power meter (OFPM) linearity standards of NMIJ (Japan) and NIST (USA) are compared using a commercial OFPM as a transfer standard at 1310 nm and

Effect of material properties on broadband electrical behavior of coplanar waveguides

June 8, 2008

Author(s)

Uwe Arz, Jens Leinhos, Michael D. Janezic

We investigate the importance of broadband substrate permittivity and loss tangent measurement for accurate calculations of the characteristic impedance and

Mixed Analog-Digital Instrumentation for Software-Defined-Radio Characterization

June 5, 2008

Author(s)

Catherine A. Remley, Nuno Carvalho, Pedro Cruz, Kevin Gard

This paper presents a new type of analog-digital mixed-domain instrument that is specially tailored for software defined radio characterization. The instrument

Controlled Encapsulation of a Hydrophilic Drug Simulant in Nano-Liposomes Using Continuous Flow Microfluidics

June 4, 2008

Author(s)

Andreas Jahn, Joseph E. Reiner, Wyatt N. Vreeland, Don DeVoe, Laurie E. Locascio, Michael Gaitan

A new method to tailor the size and size distribution of nanometer scale liposomes and control loading of liposomes with a model drug in a continuous-flow

Policy Specification and Enforcement for Smart ID Cards Deployment

June 3, 2008

Author(s)

Ramaswamy Chandramouli

Deployment of Smart Cards for Identity Verification requires collection of credentials and provisioning of credentials from and to heterogeneous and sometimes

Fabry-Perot temperature dependence and surface-mounted optical cavities

June 2, 2008

Author(s)

Richard W. Fox

Factors that contribute to the resonance temperature dependence of low-expansion optical cavities are discussed, including deformation at the cavity ends due to

Lateral force cantilever for precise atomic force microscope friction measurements

June 2, 2008

Author(s)

Mark Reitsma, Richard S. Gates, Robert F. Cook

We present a microfabricated atomic force microscope (AFM) cantilever and associated calibration procedure that provide a path for quantitative friction

Radio Communications for Emergency Responders in High-Multipath Outdoor Environments

June 2, 2008

Author(s)

Catherine A. Remley, Galen H. Koepke, Christopher L. Holloway, Chriss A. Grosvenor, Dennis G. Camell

We present measurement data to support technology and standards development for broadband, digitally modulated radio communications used by emergency responders

Can TCP Metastability Explain Cascading Failures and Justify Flow Admission Control in the Internet?

June 2, 2008

Author(s)

Vladimir V. Marbukh

This paper discusses implications of possible metastability of TCP-type fair bandwidth sharing under random flow arrivals/departures for understanding and

Reducing Thermal Noise in Molecular Force Spectroscopy

June 2, 2008

Author(s)

Gordon A. Shaw

Molecular force spectroscopy is the practice of testing the mechanical properties of single molecules. The precision determination of these properties requires

A New Microdevice for SI-Traceable Forces in Atomic Force Microscopy

June 2, 2008

Author(s)

Gregory W. Vogl, Jason J. Gorman, Gordon A. Shaw, Jon R. Pratt

A new self-excited micro-oscillator is proposed as a velocity standard for dissemination of nanoNewton-level forces that are traceable to the International

Magneto-resistive Field Mapping of Analog Audio Tapes for Forensics Imaging

June 2, 2008

Author(s)

David P. Pappas

Magneto-resistive imaging of cassette tapes for forensic analysis applications is presented. Sample tapes were recorded on various tape recorders with events

High-Voltage Isolated Gate Drive Circuit for 10 kV, 100 A SiC MOSFET/JBS Power Modules

June 2, 2008

Author(s)

David W. Berning, Tam H. Duong, Jose M. Ortiz, Angel Rivera, Allen R. Hefner Jr.

A high-current, high-voltage-isolated gate drive circuit developed for characterization of high-voltage, high-frequency 10 kV, 100 A SiC MOSFET/JBS half-bridge

A New Oscillator for SI-Traceable Measurements in Atomic Force Microscopy

June 1, 2008

Author(s)

Gregory W. Vogl, Jason J. Gorman, Gordon A. Shaw, Jon R. Pratt

See attached.

THE 2006 ADJUSTMENT OF THE FUNDAMENTAL CONSTANTS: LOOKING TOWARDS 2010

June 1, 2008

Author(s)

David B. Newell, Peter Mohr, B N. Taylor

A new set of values of the basic fundamental constants has been recommended by the Committee on Data for Science and Technology (CODATA) (http://physics.nist

SIM COMPARISON OF DC RESISTANCE AT 1 Ohm, 1 MOhm, AND 1 GOhm

June 1, 2008

Author(s)

Dean G. Jarrett, Randolph Elmquist, Nien F. Zhang, Alejandra Tonina, Janice Fernandes, Daniel Izquierdo, Dave Inglis, Felipe Hernandez-Marquez

A regional comparison of DC resistance standards at the nominal values of 1 Ohm, 1 MOhm, and 1 GOhm has recently been completed in the System Interamericano de

HIGH RESISTANCE SCALING FROM 10 k(OHM) AND QHR STANDARDS USING A CRYOGENIC CURRENT COMPARATOR

June 1, 2008

Author(s)

Randolph Elmquist, George R. Jones Jr., Brian J. Pritchard, Marcos E. Bierzychudek, Felipe L. Hernandez

We describe a cryogenic current comparator (CCC) bridge for resistance scaling that provides improved measurement uncertainty over a range of resistance values

UNCERTAINTY EVALUATION IN A TWO-TERMINAL CRYOGENIC CURRENT COMPARATOR

June 1, 2008

Author(s)

Marcos E. Bierzychudek, Randolph Elmquist

In this paper we present the uncertainty evaluation of a new cryogenic current comparator (CCC) bridge designed to compare two-terminal 1M Ω} and 10M Ω}

A TWO-WAY JOSEPHSON VOLTAGE STANDARD COMPARISON BETWEEN NIST AND NRC

June 1, 2008

Author(s)

Yi-hua D. Tang, Barry Wood, Clark Hamilton

A two-way Josephson voltage standard (JVS) direct comparison between the National Institute of Standards and Technology (NIST) and the National Research Council

CHARACTERIZATION OF LOADING EFFECTS IN PRECISION 1 Ohm RESISTORS

June 1, 2008

Author(s)

George R. Jones Jr., Randolph Elmquist

Precision standard resistors manufactured within the last two decades using improved construction techniques and materials, such as the resistance alloy Evanohm

AUTOMATION OF 1 TOhm TO 100 TOhm ULTRA-HIGH RESISTANCE MEASUREMENTS AT NIST

June 1, 2008

Author(s)

Dean G. Jarrett, Angelica M. Muniz-Mercado, Marlin E. Kraft

The automation of ultra-high resistance measurements at the National Institute of Standards and Technology (NIST) in the range 1 TOhm to 100 TOhm has been

A Reaction-Diffusion Model for Simulating 3-D Microstructure Development of Cement Paste

May 30, 2008

Author(s)

Jeffrey W. Bullard

A New Oscillator for SI-Traceable Measurements in Atomic Force Microscopy

May 29, 2008

Author(s)

Gregory W. Vogl, Jason J. Gorman, Gordon A. Shaw, Jon R. Pratt

See attached

Translation Adequacy and Preference Evaluation Tool (TAP-ET)

May 28, 2008

Author(s)

Mark A. Przybocki, Kay Peterson, P. S. Bronsart

Evaluation of Machine Translation (MT) technology is often tied to the requirement for tedious manual judgments of translation quality. While automated MT

On Enabling a Model-based Systems Engineering Discipline

May 28, 2008

Author(s)

Peter O. Denno, Thomas Thurman, John Mettenburg, Dwayne Hardy

This paper considers the requirements of a model-based systems engineering (MBSE) discipline, and the benefits that would be realized from it. A premise of MBSE

Performance Evaluation of Speech Translation Systems

May 28, 2008

Author(s)

Brian A. Weiss, Craig I. Schlenoff, Gregory A. Sanders, Michelle P. Steves, Sherri Condon, Jon Phillips, Dan Parvaz

One of the most challenging tasks for uniformed service personnel serving in foreign countries is effective verbal communication with the local population. To

Towards a Multi-View Semantic Model for Product Feature Description

May 28, 2008

Author(s)

Patrick Hoffmann, Shaw C. Feng, Gaurav Ameta, Parisa Ghodous, Lihong Qiao

Multiple perspectives need to be included in a product development process. Engineers from different departments usually have different views on a product

The Challenge of Measuring Defects in Nanoscale Dielectrics

May 26, 2008

Author(s)

Kin P. Cheung, John S. Suehle

Defects in nanoscale gate dielectric of MOS devices can exchange charges with the substrate via quantum mechanical tunneling. This characteristic has been

Long distance optical frequency transfer over fiber: predicting the frequency stability from the fiber noise

May 19, 2008

Author(s)

Nathan R. Newbury, Paul A. Williams, William C. Swann

We have recently demonstrated the coherent transfer of an optical signal over a 251 km link of optical fiber using the standard Doppler-cancellation approach to

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