Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Use of Reverberation Chamber to Simulate the Power Delay Profile of a Wireless Environment

Published

Author(s)

Christopher L. Holloway, E Genender, Catherine A. Remley, John M. Ladbury, Galen H. Koepke, H Garbe

Abstract

Multipath propagation environment effects, such as frequency-selective fading, have a strong impact on the quality of the wireless channel. For example, multipath can impact bit error rate (BER) differently than Gaussian noise. For testing wireless devices/systems in these multipath environments it is imperative to have a reliable, controllable, and statistically repeatable measurement facility. The purpose of this paper is to illustrate how the reverberation chamber can be used to simulate different multipath propagation environments. Channel characteristics, such as power delay profile, RMS delay spread, and the Rician K-factor are examined. Results for different chamber configurations (e.g., loading of the chamber, antenna positions, etc.) are compared and their effects are discussed. Results achieved inside a chamber are compared with those obtained in an actual industrial environment.
Proceedings Title
EMC Europe 2008
Conference Dates
September 7-12, 0008
Conference Location
hamburg

Keywords

reverberation chamber, wireless device testing, multipath propagation

Citation

Holloway, C. , Genender, E. , Remley, C. , Ladbury, J. , Koepke, G. and Garbe, H. (2008), Use of Reverberation Chamber to Simulate the Power Delay Profile of a Wireless Environment, EMC Europe 2008, hamburg, -1, [online], https://doi.org/10.1109/EMCEUROPE.2008.4786832 (Accessed December 1, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created September 8, 2008, Updated November 10, 2018