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PUBLICATIONS

Bilateral comparison on polarization mode dispersion between KRISS and NIST

Published

Author(s)

Seung-kwan Kim, Paul A. Williams

Abstract

We made an international bilateral comparison on polarization mode dispersion between KRISS and NIST. Three mode-coupled artifacts were used for comparison. The average values of differential group delay measured by both institutes agreed well within their uncertainties.
Proceedings Title
Proceedings of NEWRAD 2008
Conference Dates
October 13-16, 2008
Conference Location
Daejeon
Conference Title
NEWRAD 08
Pub Type
Conferences

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Keywords

bilateral comparison, PMD, polarization-mode dispersion, artifact standard, NIST, KRISS
Documentary standards

Citation

Kim, S. and Williams, P. (2008), Bilateral comparison on polarization mode dispersion between KRISS and NIST, Proceedings of NEWRAD 2008, Daejeon, -1, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=33037 (Accessed October 15, 2025)

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Created October 10, 2008, Updated February 19, 2017
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