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Books

Measurement of Dynamic Properties in Thin-Films

December 1, 2001

Author(s)

Thomas J. Silva

I present a summary of the various techniques available for the determination of response times in magnetic recording head materials. In addition, I derive...

Critical Dimension Metrology and the Scanning Electron Microscope

December 1, 2001

Author(s)

Michael T. Postek, Andras Vladar

Metrology is a principal enabler for the development and manufacture of current and future generations of semiconductor devices. With the potential of 130-nm...

Amorphous Calcium Phosphate

November 1, 2001

Author(s)

Laurence C. Chow, E D. Eanes

Amorphous structures represent about 20% of the 60 or so different mineral types formed by the action of living organisms. Among these biogenic amorphous...

Temperature Measurement and Control in Microfluidic Systems

October 1, 2001

Author(s)

David J. Ross, Michael Gaitan, Laurie E. Locascio

We describe a technique for the measurement of fluid temperatures in microfluidic systems based on temperature-dependent fluorescence. The technique is easy to...

X-ray and Neutron Optics

October 1, 2001

Author(s)

David F. Mildner

Interfacial Properties of Hydroxyapatite Fluoroapatite and Octacalcium Phosphate

October 1, 2001

Author(s)

Ming S. Tung, Drago Skrtic

The surface properties of calcium phosphate salts, such as hydroxyapatite (OHAp), fluoroapatite (Fap) and octacalcium phosphate (OCP), determine their overall...

Crystal Growth, Characterization, and Domain Studies in Lithium Niobate and Lithium Tantalate Ferroelectrics

October 1, 2001

Author(s)

Norman Sanford, J A. Aust, J. A. Aust, K K. Kitamura, Y Furukawa

Vapor Precooling in a Pulse Tube Liquefier

September 30, 2001

Author(s)

E D. Marquardt, Ray Radebaugh, Adele P. Peskin

Cryogenic Material Properties Database

September 30, 2001

Author(s)

E D. Marquardt, J P. Le, Ray Radebaugh

Design and Test of the NIST/Lockheed Martin Miniature Pulse Tube Flight Cryocooler

September 30, 2001

Author(s)

Peter E. Bradley, Ray Radebaugh, J Xiao, D. R. Ladner

Acoustic Measurements in Gases, Chapter 10

September 15, 2001

Author(s)

Michael R. Moldover, Keith A. Gillis, John J. Hurly, J B. Mehl, J Wilhelm

Cylindrical acoustic resonators developed at the National Institute of Standards and Technology (NIST) are routinely used to measure the speed of sound in gases...

Speed of Sound as a Thermodynamic Property of Fluids

September 15, 2001

Author(s)

Daniel G. Friend

In this chapter, we review the principles of sound propagation in fluid systems. From a study of the hydrodynamic equations, sound propagation is shown to be a...

Radiation Chemical Studies of Porphyrins and Metalloporphyrins

September 1, 2001

Author(s)

Pedatsur Neta

Radiation chemical studies of porphyrins and metalloporphyrins are reviewed.

Generation of Controlled UHMWPE Wear Particle Size and Shape by Surface Texturing: Relationship Between Surface Feature Dimensions to Particle Size and Shape

August 1, 2001

Author(s)

H. W. Fang, Jan V. Sengers, Stephen M. Hsu

The Biological Macromolecule Crystallization Database

July 1, 2001

Author(s)

G L. Gilliland, Michael Tung, Jane E. Ladner

MOS Device Characterization

July 1, 2001

Author(s)

Eric M. Vogel, Veena Misra

This chapter provides a survey and discussion of the electrical characterization techniques commonly used to determine the material, performance, and...

Critical Dimension Metrology in the Scanning Electron Microscope

June 29, 2001

Author(s)

Michael T. Postek, Andras Vladar

Metrology is a principal enabler for the development and manufacture of current and future generations of semiconductor devices. With the potential of 130, 100...

Heavy Metals and Other Trace Elements Measured in Tissues of Marine Mammals Archived by the Alaska Marine Mammal Tissue Archival Project from the Bering Sea and Cook Inlet, Alaska

June 1, 2001

Author(s)

Paul R. Becker, Elizabeth A. Mackey, R. Demiralp, Michael S. Epstein, M K. Donais, W. A. Goessler, Barbara J. Porter, Stephen A. Wise

Electrical CD Metrology and Related Reference Materials

June 1, 2001

Author(s)

Michael W. Cresswell, Richard A. Allen

In the fabrication of integrated circuits, the steps of depositing a thin film of conducting material, patterning it photo-lithographically, and then etching it...

Electronic Interconnection Standards for E-Commerce

May 28, 2001

Author(s)

Michael McLay

The IPC Data Transfer Solutions (DTS) committee has created the Electronic Interconnection Standards for E-Commerce (the IPC-2500 series) to support the...

The Application of Capillary Electrophoresis in the Analysis of PCR Products Used in Genetic Typing

May 15, 2001

Author(s)

B. R. McCord, John M. Butler

Flow Measurement Proficiency Testing

April 1, 2001

Author(s)

G E. Mattingly

To eliminate measurement-base trade barriers to international commerce, Key Comparisons (KCS) are now being planned in the newly formed Working Group for Fluid...

Phase Diagrams of High Tc Superconductors

March 13, 2001

Author(s)

Winnie K. Wong-Ng

The aim of this chapter is to provide selected experimental phase diagrams of high Tc superconductors to represent various active systems of research. Among...

Neutron Activation Analysis for Calibration of Phosphorus Implantation Dose

March 1, 2001

Author(s)

Rick L. Paul, David S. Simons

The Importance of Focused Evaluations: A Case Study of TREC and DUC

March 1, 2001

Author(s)

Donna K. Harman

Evaluation has always been an important part of scientific research, and in information retrieval, this evaluation has mostly been done using test collections...

Reference Materials for DNA Analysis

March 1, 2001

Author(s)

Barbara C. Levin, D J. Reeder

Mention has already been made, in Section 5.1. Of the use of DNA-based techniques for control of microbiological DNA. In parallel to the work of ATCC the USA...

Certified Reference Materials for Microanalytical Methods

February 15, 2001

Author(s)

M. Rossbach, Rolf L. Zeisler

Proper Usage of Reference Materials

February 15, 2001

Author(s)

P. J. Jenks, Rolf L. Zeisler

Characterization and Metrology for ULSI Technology: 2000

February 1, 2001

Author(s)

David G. Seiler, Alain C. Diebold, Thomas J. Shaffner, R. C. McDonald, W M. Bullis, P. J. Smith, Erik M. Secula

Relativistic Valence Bond Theory and Its Application to Metastable Xe₂

February 1, 2001

Author(s)

Svetlana A. Kotochigova, Eite Tiesinga, I Tupitsyn

We present a new version of the relativistic configuration interaction valence bond (RCIVB) method. It is designed to perform an ab initio all-electron...

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