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Measurement of Dynamic Properties in Thin-Films



Thomas J. Silva


I present a summary of the various techniques available for the determination of response times in magnetic recording head materials. In addition, I derive useful equations for the interpretation of data in the context of the Landau-Lifshitz-Gilbert formalism. Techniques that are covered include inductive, optical, and magnetoresistive methods. Strengths and weaknesses of each technique are discussed.
Physics of Ultrahigh Density Magnetic Recording
Publisher Info
Springer Verlag,


Silva, T. (2001), Measurement of Dynamic Properties in Thin-Films, Springer Verlag, (Accessed April 12, 2024)
Created December 1, 2001, Updated June 2, 2021