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Performs research and develops metrology to advance, promote and ensure robust and quantitative microscopy and microanalysis to address stakeholder needs in diverse areas of materials science. Electron, ion, and photon interactions with matter are used to enable the compositional, structural, and morphological characterization of materials from the mesoscale to the atomic scale.
Electron, ion and photon-based microanalysis methods, instrumentation and protocols are developed to advance measurement science towards the elemental and
Advanced experimental and theoretical methods are developed to increase the accuracy and precision of X-ray line energies and information derived from X-ray
The mission of the Micro and Nanoplastic (MNP) Metrology Project is to assist regulators in assessing the human health and environmental risks associated with
Atom probe microscopy was developed over 50 years ago; however, only within the last 15 years has the technique begun to see widespread use, due to the
NIST’s Material Measurement Laboratory and Physical Measurement Laboratory are developing a first-of-kind X-ray testbed for operando monitoring of catalytic
Matthew Carbone, Fanchen Meng, Christian Vorwerk, Benedikt Mauer, Fabian Peschel, Xiaohui Qu, Eli Stavitski, Claudia Draxl, John Vinson, Deyu Lu
Spectroscopy simulations are a critical tool for the interpretation of experiment, the development of new theoretical understanding, and fast screening of new
Nicholas Ritchie, Scott A. Wight, Diana Ortiz-Montalvo, Abigail P. Lindstrom
It can be useful to register (or overlay) two sets of particle data measured from the same physical sample. However, if the two data sets were collected at
Oscar Ariel Paredes Mellone, Dimosthenis Sokaras, Trevor Willey, Michael Nielsen, John Vinson
We investigate the sensitivity and potential of a synergistic experiment-theory X-ray Raman spectroscopy (XRS) methodology on revealing and following the static
OCEAN is a versatile package for calculating both optical/UV and core-edge spectroscopy. It is a first-principles code based on both ground-state density
CLIP is an analysis program for fluorescence lifetime images. It provides the user with the ability to fit or calculate the phasor plots for lifetime decays
LEAP 4000X Si/HR Imaging time-of-flight mass spectrometer and field ion microscope. Can deliver 3-D, isotopically- and chemically- resolved images Sub-nanometer
A TESCAN MIRA3 Schottky field-emission scanning electron microscope with 4 30 mm 2 silicon x-ray drift detectors which has been automated for particle and
The NIST transition edge sensor microcalorimeter is energy dispersive x-ray spectrometer capable of ~5 eV resolution over a range of energies from hundreds to
The Bruker D8 defractometer is a general purpose X-ray diffraction system. The instrument features easy reconfiguration of the X-ray optics for a variety of
Because of their antimicrobial and antifungal properties, silver nanoparticles measuring between one and 100 nanometers (billionth of a meter) in size, are
By capping liquids with graphene, an ultrathin sheet of pure carbon, researchers at the National Institute of Standards and Technology (NIST) and their