Chris A. Michaels received his Ph.D. in physical chemistry at Columbia University in 1997, working under Professor G.W. Flynn. He came to NIST as an NRC postdoctoral research fellow in 1997 and joined the staff as a Research Chemist in 1999. During his tenure at NIST he has been involved in the development of new techniques for high spatial resolution compositional mapping, including IR near-field microscopy and IR and Raman microscopy using solid immersion optics. His current, collaborative research efforts are focused on the development of Raman imaging methods for the study of materials under mechanical stress. Notable among these efforts is the development of a Raman nanoindentation instrument that allows an in-situ probe of pressure induced phase transformations in materials.
Department of Commerce Bronze Medal, 2011
Gordon Award, Federation of Societies for Coatings Technology, 2006
Samuel Wesley Stratton Award, NIST, 2002
Chemical Science and Technology Laboratory Technical Achievement Award, NIST, 2001
Louis P. Hammett Award, Columbia University, 1996