Gerbig, Y.
, Michaels, C.
and Cook, R.
(2015),
In situ observation of the spatial distribution of crystalline phases during pressure-induced transformations of indented silicon thin films, Journal of Materials Research, [online], https://doi.org/10.1557/jmr.2014.316
(Accessed October 9, 2024)
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In situ observation of the spatial distribution of crystalline phases during pressure-induced transformations of indented silicon thin films
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Abstract
Indentation-induced phase transformation processes were studied by in situ Raman imaging of the deformed contact region of silicon, employing a Raman spectroscopy-enhanced instrumented indentation technique. This is, to our knowledge, the first sequence of Raman images documenting the evolution of the strain fields and changes in the phase distributions of a material while conducting an indentation experiment.Citation
Journal of Materials Research
Volume
30
Issue
03
Pub Type
Journals
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Keywords
Raman spectroscopy, nano-indentation, phase transformation
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Created February 14, 2015, Updated November 10, 2018