U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications by: Chris A. Michaels (Fed)

Search Title, Abstract, Conference, Citation, Keyword or Author
Displaying 1 - 25 of 39

Stress measurements in alumina by optical fluorescence: revisited

August 27, 2019
Author(s)
Robert F. Cook, Chris A. Michaels
Stress measurements in single crystal and polycrystalline alumina are revisited using a recently-developed optical fluorescence energy shift method. The method simultaneously utilizes the R1 and R2 Cr-related ruby line shifts in alumina to determine two

Two-Dimensional Strain-Mapping by Electron Backscatter Diffraction and Confocal Raman Spectroscopy

November 27, 2017
Author(s)
Andrew J. Gayle, Lawrence Henry Friedman, Ryan Beams, Brian G. Bush, Yvonne B. Gerbig, Chris A. Michaels, Mark D. Vaudin, Robert F. Cook
The strain field surrounding a spherical indentation in silicon is mapped in two dimensions (2- D) using electron backscatter diffraction (EBSD) cross-correlation and confocal Raman spectroscopy techniques. The 200 mN indentation created a 4 m diameter

Stress mapping of micromachined polycrystalline silicon devices via confocal Raman microscopy

June 15, 2014
Author(s)
Grant A. Myers, Siddharth Hazra, Maarten de Boer, Chris A. Michaels, Stephan J. Stranick, Ryan P. Koseski, Robert F. Cook, Frank W. DelRio
Stress mapping of micromachined polycrystalline silicon devices with components in various levels of uniaxial tension was performed. Confocal Raman microscopy was used to form two-dimensional maps of Raman spectral shifts, which exhibited variations on the

Indentation device for in situ Raman spectroscopic and optical studies

December 12, 2012
Author(s)
Yvonne B. Gerbig, Chris A. Michaels, Aaron M. Forster, John W. Hettenhouser, Walter E. Byrd, Dylan J. Morris, Robert F. Cook
Instrumented indentation is a widely used technique to study the mechanical behavior of materials at small length scales and thus has been exploited in particular for metals, ceramics, glasses, and polymers. Mechanical tests of bulk materials, microscopic

Surface Plasmon Polariton Raman Microscopy

January 1, 2012
Author(s)
Hae-Wook Yoo, Lee J. Richter, Hee-Tae Jung, Chris A. Michaels
We report surface plasmon polariton (SPP) mediated Raman microscopy on dielectric films in contact with a Ag layer at 785 nm with spatial resolution approaching the optical diffraction limit and reasonable spectral acquisition times. The excitation and

Comparison of the Sensitivity and Image Contrast in Spontaneous Raman and Coherent Stokes Raman Scattering Microscopy of Geometry Controlled Samples

February 9, 2011
Author(s)
Hyun M. Kim, Chris A. Michaels, Garnett W. Bryant, Stephan J. Stranick
We experimentally compare the performance and contrast differences between spontaneous and coherent Stokes Raman scattering microscopy. We demonstrate the differences on a series of geometry controlled samples that range in complexity from a point (array

Fourier Transform Spectrometry with a Near Infrared Supercontinuum Source

May 1, 2009
Author(s)
Chris A. Michaels, Tony Masiello, Pamela M. Chu
Optical fiber based supercontinuum light sources combine the brightness of lasers with the broad bandwidth of incandescent lamps and thus are promising candidates for sources in spectroscopic applications requiring high brightness and broad bandwidth. Near

Modulus and Chemical Mapping of Multi-layer Coatings

October 1, 2008
Author(s)
Aaron M. Forster, Chris A. Michaels, Li Piin Sung, Justin Lucas
Thermoplastic olefins (TPO) are polymeric materials utilized for interior and exterior automotive parts. These materials are often painted to enhance appearance and protect the soft TPO substrate. TPO materials posses a low surface energy due to the

Interfacial Characterization of Multiple Layer Coatings on Thermoplastic Olefins (TPO)

May 30, 2008
Author(s)
Aaron M. Forster, Chris A. Michaels, Justin Lucas, Li Piin Sung
Thermoplastic olefins (TPO) have made significant inroads as polymeric materials for interior and exterior automotive parts. Spray applied chlorinated polyolefins (CPO) are often used to improve paint adhesion to the low surface energy TPO substrates. The

Mid-Infrared Imaging With a Solid Immersion Lens and Broadband Laser Source

March 19, 2007
Author(s)
Chris A. Michaels
An approach to increasing the spatial resolution attainable with infrared (IR) microscopy involves the application of hemispherical solid immersion lenses (SIL). The hemispherical SIL lens can produces image formation free of geometric aberration, wherein

Depth Profiling Using C 60 + SIMS Deposition and Topography Development During Bombardment of Silicon

July 30, 2006
Author(s)
John G. Gillen, J Batteas, Chris A. Michaels, P Chi, John A. Small, Eric S. Windsor, Albert J. Fahey, Jennifer R. Verkouteren, W Kim
A C60+ primary ion source has been coupled to an ion microscope SIMS instrument to examine sputtering of silicon with an emphasis on possible application of C60+ depth profiling for high depth resolution SIMS analysis of silicon semiconductor materials