U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications by: Chris A. Michaels (Fed)

Search Title, Abstract, Conference, Citation, Keyword or Author
Displaying 26 - 39 of 39

Horizontal Growth and In Situ Assembly of Oriented Zinc Oxide Nanowires

October 1, 2004
Author(s)
Babak Nikoobakht, Chris A. Michaels, Stephan J. Stranick, Mark D. Vaudin
The positioning and directed assembly of semiconductor nanowires (NWs) is of considerable current interest for bottom-up approaches to the engineering of intricate structures from nanoscale building blocks. We report a horizontal growth mode for ZnO NWs on

Surface and Interface Properties of UV-Exposed PVDF/PMMA-CO-PEA Blends

March 5, 2003
Author(s)
Xiaohong Gu, Li Piin Sung, D L. Ho, Chris A. Michaels, D Nguyen, Y C. Jean, Tinh Nguyen
The surface and interface of PVDF blended with different amounts of poly (methyl methacrylate) and poly (ethyl acrylate) copolymer (PNMA-co-PEA) have been investigated before and after exposure to UV light. Dry free films having athickness of approximately

Chemical Imaging With Scanning Near-Field Infrared Microscopy and Spectroscopy

October 1, 2000
Author(s)
Chris A. Michaels, Lee J. Richter, Richard R. Cavanagh, Stephan J. Stranick
The development of a scanning near-field microscope that utilizes infrared absorption as the optical contrast mechanism is described. This instrument couples the nanoscale spatial resolution of a scanning probe microscope with the chemical specificity of

Scanning Near-Field Infared Microscopy and Spectroscopy with a Broadband Laser Source

October 1, 2000
Author(s)
Chris A. Michaels, Lee J. Richter, Richard R. Cavanagh, Stephan J. Stranick
Near-field scanning optical microscopy (NSOM) is a powerful tool for the characterization of the optical properties of nanoscale objects, although pervasive artifacts often create difficulties in image interpretation. A three dimensional scanning NSOM

Scanning Near-Field Infrared Microscopy and Spectroscopy With a Broadband Laser Source

October 1, 2000
Author(s)
Chris A. Michaels, Stephan J. Stranick, Lee J. Richter, Richard R. Cavanagh
A scanning near-field microscopy that allows the fast acquisition of mid-infrared absorption spectra is described. The microscope couples the nanoscale spatial resolution of a scanning probe microscope with the chemical specificity of vibrational

Assessment of Sensitivity Advances in Near-Field Raman Spectroscopy

September 1, 2000
Author(s)
Chris A. Michaels, C E. Dentinger, Lee J. Richter, D B. Chase, Richard R. Cavanagh, Stephan J. Stranick
Near-field Raman spectroscopy can be used to obtain images with both chemical specificity and the subwavelength spatial resolution of near-field scanning optical microscopy (NSOM). In the absence of signal intensification factors, such as surface

Nanoscale Chemical Imaging With Scanning Near-Field Infrared Microscopy

June 1, 1999
Author(s)
Chris A. Michaels, Stephan J. Stranick, Lee J. Richter, Richard R. Cavanagh
The development of a near-field microscope that utilizes infrared absorption as the optical contrast mechanism will be described. This instrument couples the nanoscale spatial resolution of a scanning probe microscope with the chemical specificity of