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Donald Windover


Donald Windover is a member of the  Microscopy and Microanalysis Research Group in the Materials Measurement Science Division of the Materials Measurement Laboratory of NIST.

Dr. Windover began his career at NIST working in the area of X-ray metrology and aided in the development of Standard Reference Materials (SRMs) for X-ray scattering methods as well as one-of-a-kind instrumentation to reduce measurement uncertainties in certification data.  In his time at NIST he has worked extensively in the areas of X-ray reflectometry, angle metrology, wavelength metrology, X-ray optics design, optical encoder integration, critical dimension small angle X-ray scattering (CD-SAXS) measurement design and data analysis, and multivariate modeling of X-ray scattering data using differential evolution optimization and weighted statistical sampling Monte-Carlo methodologies.  His present work involves optimization of sampling and threshold detection limits with X-ray Fluorescence measurement instrumentation.


Metrological Tools for the Reference Materials and Reference Instruments of the NIST Material Measurement Laboratory

Carlos R. Beauchamp, Johanna Camara, Jennifer Carney, Steven J. Choquette, Kenneth D. Cole, Paul C. DeRose, David L. Duewer, Michael S. Epstein, Margaret C. Kline, Katrice A. Lippa, Enrico Lucon, Karen W. Phinney, Maria Polakoski, Antonio M. Possolo, Katherine E. Sharpless, John R. Sieber, Blaza Toman, Michael R. Winchester, Donald A. Windover
The National Institute of Standards and Technology (NIST), formerly the National Bureau of Standards, was established by the U.S. Congress in 1901 and charged

High-precision measurement of the X-ray Cu K-alpha spectrum

Marcus H. Mendenhall, Albert Henins, Lawrence T. Hudson, Csilla I. Szabo-Foster, Donald A. Windover, James P. Cline
The structure of the x-ray emission lines of the Cu Kα complex has been remeasured on a newly commissioned instrument, in a manner directly traceable to the
Created October 9, 2019