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Donald Windover (Fed)

Physicist

Donald Windover is a member of the  Microscopy and Microanalysis Research Group in the Materials Measurement Science Division of the Materials Measurement Laboratory of NIST.

Dr. Windover began his career at NIST working in the area of X-ray metrology and aided in the development of Standard Reference Materials (SRMs) for X-ray scattering methods as well as one-of-a-kind instrumentation to reduce measurement uncertainties in certification data.  In his time at NIST he has worked extensively in the areas of X-ray reflectometry, angle metrology, wavelength metrology, X-ray optics design, optical encoder integration, critical dimension small angle X-ray scattering (CD-SAXS) measurement design and data analysis, and multivariate modeling of X-ray scattering data using differential evolution optimization and weighted statistical sampling Monte-Carlo methodologies.  His present work involves optimization of sampling and threshold detection limits with X-ray Fluorescence measurement instrumentation.

Publications

Metrological Tools for the Reference Materials and Reference Instruments of the NIST Material Measurement Laboratory

Author(s)
Carlos R. Beauchamp, Johanna Camara, Jennifer Carney, Steven J. Choquette, Kenneth D. Cole, Paul C. DeRose, David L. Duewer, Michael Epstein, Margaret Kline, Katrice Lippa, Enrico Lucon, John L. Molloy, Michael Nelson, Karen W. Phinney, Maria Polakoski, Antonio Possolo, Lane C. Sander, John E. Schiel, Katherine E. Sharpless, Michael R. Winchester, Donald Windover
The National Institute of Standards and Technology (NIST), formerly the National Bureau of Standards, was established by the U.S. Congress in 1901 and charged

Metrological Tools for the Reference Materials and Reference Instruments of the NIST Material Measurement Laboratory

Author(s)
Carlos R. Beauchamp, Johanna Camara, Jennifer Carney, Steven J. Choquette, Kenneth D. Cole, Paul C. DeRose, David L. Duewer, Michael Epstein, Margaret C. Kline, Katrice Lippa, Enrico Lucon, Karen W. Phinney, Maria Polakoski, Antonio Possolo, Katherine E. Sharpless, John R. Sieber, Blaza Toman, Michael R. Winchester, Donald Windover
The National Institute of Standards and Technology (NIST), formerly the National Bureau of Standards, was established by the U.S. Congress in 1901 and charged
Created October 9, 2019, Updated June 15, 2021