Donald Windover is a member of the Microscopy and Microanalysis Research Group in the Materials Measurement Science Division of the Materials Measurement Laboratory of NIST.
Dr. Windover began his career at NIST working in the area of X-ray metrology and aided in the development of Standard Reference Materials (SRMs) for X-ray scattering methods as well as one-of-a-kind instrumentation to reduce measurement uncertainties in certification data. In his time at NIST he has worked extensively in the areas of X-ray reflectometry, angle metrology, wavelength metrology, X-ray optics design, optical encoder integration, critical dimension small angle X-ray scattering (CD-SAXS) measurement design and data analysis, and multivariate modeling of X-ray scattering data using differential evolution optimization and weighted statistical sampling Monte-Carlo methodologies. His present work involves optimization of sampling and threshold detection limits with X-ray Fluorescence measurement instrumentation.
Key Words: X-Ray Reflectometry (XRR), X-Ray Diffraction (XRD), X-Ray Metrology, Dimensional Metrology, High Resolution X-Ray Diffraction (HRXRD), X-Ray Fluorescence (XRF)
2018: Department of Commerce, Gold Medal