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Search Publications by: Donald Windover (Fed)

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Displaying 1 - 25 of 28

Powder X-ray structural analysis and band gap measurements for (CaxSr2-x)MnWO6 (x = 0.25, 0.5, 0.75, 1.5, 1.75).

June 1, 2022
Author(s)
Winnie Wong-Ng, YuQi Yang, Yu-Cheng Lan, GuangYao Liu, Amrit Kafle, Weifang Liu, Jie Hou, Donald Windover, Qingzhen Huang, Sergiy Krylyuk, James A. Kaduk
The structure, powder diffraction patterns and band gap measurements of a series of manganese- and tungsten-containing alkaline-earth double perovskites (CaxSr2-x)MnWO6 (x=0.25, 0.5, 0.75, 1.5, 1.75) have been investigated. Powder X-ray diffraction

Metrological Tools for the Reference Materials and Reference Instruments of the NIST Material Measurement Laboratory

September 16, 2021
Author(s)
Carlos R. Beauchamp, Johanna Camara, Jennifer Carney, Steven J. Choquette, Kenneth D. Cole, Paul C. DeRose, David L. Duewer, Michael Epstein, Margaret Kline, Katrice Lippa, Enrico Lucon, John L. Molloy, Michael Nelson, Karen W. Phinney, Maria Polakoski, Antonio Possolo, Lane C. Sander, John E. Schiel, Katherine E. Sharpless, Michael R. Winchester, Donald Windover
The National Institute of Standards and Technology (NIST), formerly the National Bureau of Standards, was established by the U.S. Congress in 1901 and charged with establishing a measurement foundation to facilitate U.S. and international commerce. NIST

Polarization Effects of X-ray Monochromators Modeled Using Dynamical Scattering Theory

July 1, 2021
Author(s)
Marcus Mendenhall, David R. Black, Donald Windover, James Cline
The difference in the diffracted intensity of the sigma-and pi-polarized components of an X-ray beam in powder diffraction has generally been treated according to equations based on dipole scattering, also known as kinematic X-ray scattering. Although this

Crystal Chemistry, X-ray Diffraction Reference Patterns, and Band Gap Studies for (BaxSr1-x)2CoWO6 (x=0.1, 0.2, 0.3, 0.5, 0.7, 0.9)

September 11, 2020
Author(s)
Winnie K. Wong-Ng, Guangyao Liu, Yuqi Yang, Rola M. Derbeshi, Donald A. Windover, James A. Kaduk
X-ray reference powder patterns and structures have been determined for a series of cobalt- and tungsten-containing cubic alkaline-earth perovskites, (BaxSr1-x)2CoWO6 (x=0.1, 0.2, 0.3, 0.5, 0.7, 0.9). The structure of the end members of the series

Metrological Tools for the Reference Materials and Reference Instruments of the NIST Material Measurement Laboratory

July 15, 2020
Author(s)
Carlos R. Beauchamp, Johanna Camara, Jennifer Carney, Steven J. Choquette, Kenneth D. Cole, Paul C. DeRose, David L. Duewer, Michael Epstein, Margaret C. Kline, Katrice Lippa, Enrico Lucon, Karen W. Phinney, Maria Polakoski, Antonio Possolo, Katherine E. Sharpless, John R. Sieber, Blaza Toman, Michael R. Winchester, Donald Windover
The National Institute of Standards and Technology (NIST), formerly the National Bureau of Standards, was established by the U.S. Congress in 1901 and charged with establishing a measurement foundation to facilitate U.S. and international commerce. NIST

High-precision measurement of the X-ray Cu K-alpha spectrum

May 12, 2017
Author(s)
Marcus H. Mendenhall, Albert Henins, Lawrence T. Hudson, Csilla I. Szabo-Foster, Donald A. Windover, James P. Cline
The structure of the x-ray emission lines of the Cu Kα complex has been remeasured on a newly commissioned instrument, in a manner directly traceable to the Système Internationale definition of the meter. In this measurement, the region from 8000 to 8100

Advancing X-Ray Scattering Metrology Using Inverse Genetic Algorithms

July 7, 2016
Author(s)
Adam F. Hannon, Daniel F. Sunday, Donald A. Windover, Regis J. Kline
We compare the speed and effectiveness of two genetic optimization algorithms to the results of statistical sampling via a Markov Chain Monte Carlo algorithm to find which is the most robust method for determining real space structure in periodic gratings

Certification of Standard Reference Material 1878b Respirable Alpha Quartz

June 9, 2016
Author(s)
David R. Black, Marcus H. Mendenhall, Pamela S. Whitfield, Donald A. Windover, Albert Henins, James J. Filliben, James P. Cline
The National Institute of Standards and Technology (NIST) certifies a suite of Standard Reference Materials (SRMs) to address specific aspects of the performance of X-ray powder diffraction instruments. This report describes SRM 1878b, the third generation

The Optics and Alignment of the Divergent Beam Laboratory X-ray Powder Diffractometer and its Calibration with NIST Standard Reference Materials

September 25, 2015
Author(s)
James P. Cline, Marcus H. Mendenhall, David R. Black, Donald A. Windover, Albert Henins
The laboratory X-ray powder diffractometer is one of the primary analytical tools in materials science. It is applicable to nearly any crystalline material, and with advanced data analysis methods, it can provide a wealth of information concerning sample

An algorithm for compensation of short-period errors in optical encoders

September 24, 2015
Author(s)
Marcus H. Mendenhall, Donald A. Windover, Albert Henins, James P. Cline
We present a simple way to collect data from an optical position or angle encoder with a readout which interpolates values between the optical features, and to process this data set so as to determine the short-range errors which arise from an

Certification of Standard Reference Material 1976b

September 15, 2015
Author(s)
David R. Black, Donald A. Windover, Marcus H. Mendenhall, Albert Henins, James J. Filliben, James P. Cline
The National Institute of Standards and Technology (NIST) certifies a suite of Standard Reference Materials (SRMs) to address specific aspects of the performance of X-ray powder diffraction instruments. This report describes SRM 1976b, the third generation

Limitations of X-ray reflectometry in the presenceof surface contamination

June 13, 2012
Author(s)
Donald A. Windover, David L. Gil
Intentionally deposited thin films exposed to atmosphere often develop unintentionally deposited few monolayer films of surface contamination. This contamination arises from the diverse population of volatile organics and inorganics in the atmosphere. Such

Thickness and Composition Reference Standards for Semiconductor Metrology

July 22, 2011
Author(s)
Donald Windover, Victor H. Vartanian, Tom Kelly, Tom Larson, David L. Gil
This report from the MET16 project describes tests of X-ray reflectometry (XRR), X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), and atom probe tomography (APT) for thickness and compositional reference metrology.

Certification of Standard Reference Material 660b

June 1, 2011
Author(s)
David R. Black, Donald A. Windover, Albert Henins, James J. Filliben, James P. Cline
The National Institute of Standards and Technology (NIST) certifies a suite of Standard Reference Materials (SRMs) to address specific aspects of instrument performance of powder diffractometers. This report describes SRM 660b, the third generation of this

DEoptim: An R Package for Global Optimization by Differential Evolution

May 1, 2011
Author(s)
Katharine M. Mullen, David Ardia , David L. Gil, Donald A. Windover, James P. Cline
This article describes the R package DEoptim which implements the differential evolution algorithm for the global optimization of a real-valued function of a real-valued parameter vector. The implementation of differential evolution in DEoptim interfaces

Standard Reference Material 660b for X-ray Metrology

August 1, 2010
Author(s)
David R. Black, Donald A. Windover, Albert Henins, James J. Filliben, James P. Cline
The National Institute of Standards and Technology (NIST) certifies a suite of Standard Reference Materials (SRMs) to address specific aspects of instrument performance of powder diffractometers. This report describes SRM 660b, the third generation of this

Certification of NIST Standard Reference Material 640d

June 1, 2010
Author(s)
David R. Black, Donald A. Windover, Albert Henins, David L. Gil, James J. Filliben, James P. Cline
The National Institute of Standards and Technology (NIST) certify a variety of standard reference materials (SRM) to address specific aspects of instrument performance for divergent beam diffractometers. This report describes SRM 640d, the fifth generation

Standard Reference Material 640d for X-ray Metrology

June 1, 2010
Author(s)
David R. Black, Donald A. Windover, Albert Henins, David L. Gil, James J. Filliben, James P. Cline
The National Institute of Standards and Technology (NIST) certify a variety of standard reference materials (SRM) to address specific aspects of instrument performance for divergent beam diffractometers. This report describes SRM 640d, the fifth generation