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High-precision measurement of the X-ray Cu K-alpha spectrum

Published

Author(s)

Marcus H. Mendenhall, Albert Henins, Lawrence T. Hudson, Csilla I. Szabo-Foster, Donald A. Windover, James P. Cline

Abstract

The structure of the x-ray emission lines of the Cu Kα complex has been remeasured on a newly commissioned instrument, in a manner directly traceable to the Système Internationale definition of the meter. In this measurement, the region from 8000 to 8100 eV has been covered with a highly precise angular scale, and well-defined system efficiency, providing accurate wavelengths and relative intensities. This measurement updates the standard multi-Lorentzian-fit parameters from Härtwig, Hölzer, et al, and is in modest disagreement with their results for the wavelength of the Kα1 line when compared via quadratic fitting of the peak top; the intensity ratio of Kα1 to Kα2 agrees within the combined error bounds. However, the position of the fitted top of Kα1 is very sensitive to the fit parameters, so it is not believed to be a robust value to nist-quote without further qualification. We also provide accurate intensity and wavelength information for the socalled Kα3,4 'satellite' complex. Supplementary data, available online at stacks.iop.org/JPB/50/ 115004/mmedia, is provided which gives the entire shape of the spectrum in this region, allowing it to be used directly in cases where simplified, multi-Lorentzian fits to it are not sufficiently accurate.
Citation
Journal of Physics B-Atomic Molecular and Optical Physics
Volume
50
Issue
11

Keywords

x-ray spectroscopy, copper, wavelength standard, x-ray diffraction
Created May 12, 2017, Updated November 10, 2018