The Bruker D8 defractometer is a general purpose X-ray diffraction system. The instrument features easy reconfiguration of the X-ray optics for a variety of experimental configurations. The combination of the Gobel parabolic X-ray mirror and Cu-Ka X-ray source at 40 kV produce a beam intensity in the range of 1000's of counts per second , making the instrument well suited for phase identification and trace analysis. The cradle is configured with a spring loaded sample stage that allows for a wide range of samples and specimen holders to be loaded and aligned with relative ease. The instrument is equipped with two detectors, a standard scintillation detector, and a LynxEye Super Speed detector. The scintillation detector is optimal for small angles near a direct beam condition and for cases where signal to background is a concern. The LynxEyx detector is 1 dimensional solid state array detector, being able to acquire a 4 degree window at 0.02 degree resolution, designed for rapid data acquisition.
The Bruker Diffrac-Plus data acquisition and analysis package includes an experiment building application that facilitates the design of long experimental sessions such as k-space mapping. The analysis of acquired data can be accomplished through either Bruker's EVA package or MDI Jade, both of which have phase identification capabilities. The also has access to a library of common phases in the form of powder diffraction files (pdf format).
Cu-Ka Source (lambda = 0.15418 nm)
5 axis Eulerian cradle (chi: -5 to+55 degree tilt range 0.02 degree step, phi: unlimited rotation 0.001 degree step, x,y: 100 mm of travel, z: 50 mm of travel)
laser video based sample alignment
LynxEye Super Speed detector
Gobel Mirror optics as well as direct beam configuration
Bragg-Brentano and alternate measurement geometries
Multiple specimen holders for various sample sizes and types
EVA and MDI Jade data processing software with pdf database
XRD wizard and XRD commander control and automation software