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Material Measurement Laboratory /Materials Measurement Science Division

Microscopy and Microanalysis Research Group

The Group performs fundamental research and develops metrology towards the compositional and morphological characterization of materials from the mesoscale to the atomic scale using electron, ion, and photon interactions with matter; detailed measurements, comprehensive analysis and modeling, and theoretical methods serve to advance microanalysis to address stakeholder needs in diverse areas of materials science.

News and Updates

Projects and Programs

Publications

Revealing Electronic Signature of Lattice Oxygen Redox in Lithium Ruthenates and Implications for High-Energy Li-ion Battery Material Designs

Author(s)
Yang Yu, Pinar Karayaylali, Stanislaw Nowak, Livia Giordano, Magali Gauthier, Wesley Hong, Ronghui Kuo, John T. Vinson, Sokaras Dimosthenis, Cheng-Jun Sun, Nenian Charles, Filippo Maglia, Roland Jung, Yang Shao-Horn
Anion redox in lithium transition metal oxides such as Li2RuO3 and Li2MnO3, has catalyzed intensive research efforts on the seek of first-row transition metal

Resonant X-ray Emission and Valence-band Lifetime Broadening in LiNO3

Author(s)
John Thomas Vinson, Terrence J. Jach, Matthias Mueller, Rainer Unterumsberger, Burkhard Beckhoff
X-ray absorption and resonant inelastic x-ray scattering measurements are carried out on lithium nitrate LiNO3. Echoing previous studies on ammonium nitrate,

Software

DTSA II

NIST DTSA-II

NIST DTSA-II builds on the best available algorithms in the literature to simulate, quantify and plan energy dispersive x-ray analysis measurements.

Tools and Instruments

Milli X-Ray Fluorescence Spectrometer

The Eagle III Micro XRF unit is similar to a traditional XRF unit, with the primary difference being that the X-rays are focused by a polycapillary optic into a

X-Ray Diffractometer

The Bruker D8 defractometer is a general purpose X-ray diffraction system. The instrument features easy reconfiguration of the X-ray optics for a variety of

Field Emission Electron Probe

The JEOL JXA 8500f is a thermal field emission electron microprobe capable of performing quantitative X-ray microanalysis and secondary and backscattered

Awards

Contacts

Group Leader