Microscopy and Microanalysis Research Group
The Group performs fundamental research and develops metrology towards the compositional and morphological characterization of materials from the mesoscale to the atomic scale using electron, ion, and photon interactions with matter; detailed measurements, comprehensive analysis and modeling, and theoretical methods serve to advance microanalysis to address stakeholder needs in diverse areas of materials science.
Programs and Projects:
- Nanometrology: Measurement Science for the Composition and Structure of Nanomaterials
- Safety, Security & Forensics: Measurement Science for Forensics and Advanced Applications
- Advanced Materials Design and Characterization: Advances in X-ray Science for Standards and Analysis
- Advanced Materials Design and Characterization: Advances in Elemental and Chemical Analysis of Microstructured Materials
