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Material Measurement Laboratory /Materials Measurement Science Division

Microscopy and Microanalysis Research Group

The Group performs fundamental research and develops metrology towards the compositional and morphological characterization of materials from the mesoscale to the atomic scale using electron, ion, and photon interactions with matter; detailed measurements, comprehensive analysis and modeling, and theoretical methods serve to advance microanalysis to address stakeholder needs in diverse areas of materials science.

News and Updates

Activities

MNP Metrology Program

Microplastic and Nanoplastic Metrology

Ongoing
The mission of the Micro and Nanoplastic (MNP) Metrology Project is to assist regulators in assessing the human health and environmental risks associated with

Publications

The local structure of sulfur vacancies on the basal plane of monolayer MoS2

Author(s)
Angel Garcia-Esparza, Sangwook Park, Abrosham Hadi, John Vinson, Baxter Abraham, Alessandro Gallo, Dennis Nordlund, Taeho Roy Kim, Roberto Alonso-Mori, Jean-Luc Brédas, Xiaolin Zheng, Dimosthenis Sokaras
The nature of the S-vacancy is central to controlling the electronic properties of monolayer MoS2. Understanding the geometric and electronic structures of the

Software

DTSA II

NIST DTSA-II

NIST DTSA-II builds on the best available algorithms in the literature to simulate, quantify and plan energy dispersive x-ray analysis measurements.
The measured and calculated RIXS maps at the oxygen K edge of lithium peroxide

OCEAN

OCEAN is a versatile package for calculating both optical/UV and core-edge spectroscopy. It is a first-principles code based on both ground-state density

Tools and Instruments

HNL650-small

Focused Ion Beam (Helios 660)

The Helios 660 NanoLab(HNL660) is a Focused Ion Beam Scanning Electron Microscope equipped with spectroscopic detectors to allow elemental and phase

X-Ray Diffractometer

The Bruker D8 defractometer is a general purpose X-ray diffraction system. The instrument features easy reconfiguration of the X-ray optics for a variety of

Microcalorimeter Detector

The NIST transition edge sensor microcalorimeter is energy dispersive x-ray spectrometer capable of ~5 eV resolution over a range of energies from hundreds to

Awards

Contacts

Group Leader