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Projects/Programs

Displaying 1 - 13 of 13

Diffraction Metrology and Standards

Ongoing
Our objective is the development of Standard Reference Materials ( SRMs) and quantitative, reproducible, and accurate measurement methods for characterization

METIS

Ongoing
A new publication describes METIS, a Metrology Exchange to Innovate in Semiconductors We are seeking comments on the draft publication through February 16, 2024

Nanocalorimetry Measurements

Ongoing
Nanocalorimetry provides a capability to measure the thermal properties of very small samples and at very fast rates. Materials and interfaces of interest

Powder Diffraction SRMs

Ongoing
The work carried out under this project creates a wide variety of X-ray powder diffraction (XRPD) Standard Reference Materials (SRMs) used to calibrate and