NIST Gallery of Distinguished Alumni 2025 Honorees

Robert E. Drullinger
Physical Measurement Laboratory, 1972-2002
For his essential role in the first demonstration of laser cooling of atoms, for the development of NIST-7, the first primary frequency standard using optical state selection and detection, and for impacts to the redefinition of the meter

Richard H.F. Jackson
Engineering Laboratory, 1971-2000
For his pioneering research and visionary leadership of NIST's manufacturing programs, which helped to transform manufacturing into a higher quality and dramatically more efficient information driven enterprise

Gregory J. Rosasco
Physical Measurement Laboratory, 1969-2000; 2002-2006
For excellence in research on the application of Raman spectroscopy to practical measurements and in the management of NIST technical divisions with the highest dedication

Susannah B. Schiller
Office of Information Systems Management, 1987-2020
For advancing statistical methods that improved accuracy in the characterization of SRMs and visionary leadership that modernized NIST's IT services positioning NIST to readily meet challenging federal mandates and advance NIST's mission priorities

Annie J. Smith
Communications Technology Laboratory and Boulder Labs, 1989-2018
For exemplary contributions to NIST Boulder Laboratory administrative programs, overcoming Division and Organizing Unit boundaries, supporting NIST's goals

Stephan J. Stranick
Material Measurement Laboratory, 1996-2024
For world leadership in the execution of innovative microscopy techniques, programmatic leadership in other agency partnerships significant to national security, and a prodigious record of mentorship

William H. Twilley
Engineering Laboratory, 1978-2004
For realizing the most significant measurement achievement in fire science of the twentieth century, the measurement of heat release rate using oxygen consumption calorimetry

Theodore V. Vorburger
Physical Measurement Laboratory, 1972-2009
For seminal contributions to the science and technology of surface metrology that underpin a broad range of industry relevant measurements, and provide a foundational scientific basis for firearm and toolmark forensics