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Electronics

In the realm of electrons and light, NIST provides the standards, develops the instruments and performs the calibrations necessary to keep both the smallest electronic components and the largest power grids running smoothly and safely.

Next-Generation Chips Require Multiple Measurement Approaches

Illustration: Computer chip in middle; surrounded by images of different scanning techniques
Credit: G. Orji and B. Barnes/NIST
Measurement science—or metrology—is critically important in computer chips, from design to manufacturing and quality control.

The metrology requirements for next-generation computer chips are stringent and specialized. No single instrument has the speed and sensitivity that’s needed to characterize a host of complex material parameters and measure all of a chip’s dimensions—the tiny sizes and distances between its various features.

Learn more about NIST's work in this space.

News and Updates

Industry Impacts

Projects and Programs

Spin Dynamics and Magnetic Microscopy

The Spin Dynamics and Magnetic Microscopy Project develops metrology for magnetodynamic effects such as ferromagnetic resonance, switching, and damping. We

Fiber Sources and Applications

Optical frequency combs convert a laser source containing a single frequency of light into pulses that include thousands of frequencies. This project aims to

Publications

Expanding the Capability of Microwave Multiplexed Readout for Fast Signals in Microcalorimeters

Author(s)
Kelsey M. Morgan, Daniel T. Becker, Douglas A. Bennett, Johnathon D. Gard, Jozsef Imrek, John A. Mates, Christine G. Pappas, Carl D. Reintsema, Daniel R. Schmidt, Joel N. Ullom, Joel C. Weber, Abigail L. Wessels, Daniel S. Swetz
Microwave SQUID multiplexing has become a key technology for reading out large arrays of X-ray and gamma-ray microcalorimeters with mux factors of 100 or more

Nanobolometer with ultralow noise equivalent power

Author(s)
Roope J. Kokkoniemi, Joonas Govenius, Visa Vesterinen, Russell Lake, A M. Gunyho, K-Y Tan, S Simbierowicz, Leif Gronberg, J Lehtinen, M Prunnila, Juha Hassel, Antti Lamminen, O P. Saira, Mikko Mottonen
Since the introduction of bolometers more than a century ago, they have been used in various applications ranging from chemical sensors, consumer electronics

Software

On-Wafer Calibration Software

NIST Microwave Uncertainty Framework (Beta version) The NIST Microwave Uncertainty Framework provides a "drag-and-drop" toolkit for managing the calculation of

Timebase Correction Software

The Timebase Correction (TBC) software package , used with high-speed sampling oscilloscopes, can correct both random and systematic timebase errors using

Tools and Instruments

Molecular Beam Epitaxy (MBE) Facility

The Applied Physics Division utilizes a fully automated, dual-chamber molecular beam epitaxy (MBE) system for the growth of advanced, compound semiconductor

Nanocalorimeter Measurement System

This Nanocalorimeter Measurement System is used for nanocalorimetry measurements at fast heating rates (100 °C/s to 100,000 °C/s) and measurements of samples

Awards