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Electronics

In the realm of electrons and light, NIST provides the standards, develops the instruments and performs the calibrations necessary to keep both the smallest electronic components and the largest power grids running smoothly and safely.

Next-Generation Chips Require Multiple Measurement Approaches

Illustration: Computer chip in middle; surrounded by images of different scanning techniques
Credit: G. Orji and B. Barnes/NIST
Measurement science—or metrology—is critically important in computer chips, from design to manufacturing and quality control.

The metrology requirements for next-generation computer chips are stringent and specialized. No single instrument has the speed and sensitivity that’s needed to characterize a host of complex material parameters and measure all of a chip’s dimensions—the tiny sizes and distances between its various features.

Learn more about NIST's work in this space.

News and Updates

Industry Impacts

Projects and Programs

Thin Film Electronics

The Thin Film Electronics Project develops rigorous measurements and methodology needed for continued U.S. leadership in manufacturing and innovation of

Nanobiotechnology

We are developing methods, technology, and theories to enable the efficient detection, characterization, and identification of biological molecules. Our focus

Flexible and Printed Electronics

Organic electronics and photovoltaic technology are reaching critical mass with the establishment of a U.S. consortium and the recent introduction of new

Publications

Streaming Batch Eigenupdates for Hardware Neural Networks

Author(s)
Brian D. Hoskins, Matthew W. Daniels, Siyuan Huang, Advait Madhavan, Gina C. Adam, Nikolai B. Zhitenev, Jabez J. McClelland, Mark D. Stiles
Neuromorphic networks based on nanodevices, such as metal oxide memristors, phase change memories, and flash memory cells, have generated considerable interest

Quantized Pulse Propagation in Josephson Junction Arrays

Author(s)
Christine A. Donnelly, Justus A. Brevik, Nathan E. Flowers-Jacobs, Anna E. Fox, Paul D. Dresselhaus, Peter F. Hopkins, Samuel P. Benz
We present time-domain electrical measurements and simulations of the quantized voltage pulses that are generated from series-connected Josephson junction (JJ)

Software

On-Wafer Calibration Software

NIST Microwave Uncertainty Framework (Beta version) The NIST Microwave Uncertainty Framework provides a "drag-and-drop" toolkit for managing the

Timebase Correction Software

The Timebase Correction (TBC) software package , used with high-speed sampling oscilloscopes, can correct both random and systematic timebase errors using

Tools and Instruments

Molecular Beam Epitaxy (MBE) Facility

The Applied Physics Division utilizes a fully automated, dual-chamber molecular beam epitaxy (MBE) system for the growth of advanced, compound semiconductor

Nanocalorimeter Measurement System

This Nanocalorimeter Measurement System is used for nanocalorimetry measurements at fast heating rates (100 °C/s to 100,000 °C/s) and measurements of samples

Awards