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Search Publications by: Gene C. Hilton (Assoc)

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Displaying 126 - 150 of 166

Transition Edge Sensor Array Development

March 1, 2001
Author(s)
Steven Deiker, James A. Chervenak, Gene C. Hilton, Kent D. Irwin, John M. Martinis, Sae Woo Nam, David A. Wollman
NIST is fabricating multi-pixel arrays of our transition edge sensor (TES) microcalorimeter detectors for use in microanalysis and x-ray astrophysics. We have developed room temperature digital feedback electronics and a successful SQUID multiplexing

Low Voltage Microanalysis using Microcalorimeter EDS

January 1, 2001
Author(s)
David A. Wollman, Sae Woo Nam, Gene C. Hilton, Kent D. Irwin, David A. Rudman, Norman F. Bergren, Steven Deiker, John M. Martinis, Martin Huber, Dale Newbury
We present the current performance of the prototype high-resolution microcalorimeter energy-dispersive spectrometer (υcal EDS) developed at NIST for x-ray microanalysis. In particular, the low-energy υcal EDS designed for operation in the energy range from

A Mo-Cu Superconducting Transition-Edge Microcalorimeter with 4.5 eV Energy Resolution at 6 keV

December 31, 2000
Author(s)
Kent D. Irwin, Gene C. Hilton, John M. Martinis, Steven Deiker, Norman F. Bergren, Sae Woo Nam, David A. Rudman, David A. Wollman
We describe a superconducting transition-edge microcalorimeter with an energy resolution of 4.5 1 0.1 eV full-width at half-maximum (FWHM) for Mn Kα X-rays from an 55Fe source. The thermometer consists of a photolithographically patterned Mo-Cu

Multiplexed Readout of Superconducting Bolometers

December 31, 2000
Author(s)
D. J. Benford, C. A. Allen, James A. Chervenak, M. M. Freund, A. S. Kutyrev, S. H. Mosely, Rick A. Shafer, Johannes G. Staguhn, Erich N. Grossman, Gene C. Hilton, Kent D. Irwin, John M. Martinis, Sae Woo Nam, Carl D. Reintsema
Studies of astrophysical emission in the far-infrared and submillimeter require large arrays of detectors containing from hundreds to thousands of elements. A multiplexed readout is necessary for practical implementation of such arrays, and can be

Superconducting Transition-Edge-Microcalorimeter X-ray Spectrometer with 2 eV Energy Resolution at 1.5 keV

December 31, 2000
Author(s)
David A. Wollman, Sae Woo Nam, Dale Newbury, Gene C. Hilton, Kent D. Irwin, Norman F. Bergren, Steven Deiker, David A. Rudman, John M. Martinis
We describe the operation and performance of a prototype microcalorimeter ?energy-dispersive? (nondispersive) x-ray spectrometer (mcal EDS) developed at NIST for use in x-ray microanalysis and x-ray astronomy. The low-energy microcalorimeter detector

Development of Arrays of TES X-ray Detectors

December 1, 2000
Author(s)
Steven Deiker, James A. Chervenak, Gene C. Hilton, Martin Huber, Kent D. Irwin, John M. Martinis, Sae Woo Nam, David A. Wollman
Both the x-ray astrophysics and microanalysis communities have a need for large format arrays of high-spectral-resolution x-ray detectors. To meet this need, we are transferring our successful single pixel Transition Edge Sensor (TES) x-ray

First Steps Towards Small Arrays of Mo/Au Microcalorimeters

December 1, 2000
Author(s)
J. Olsen, E. C. Kirk, K. Thomsen, B. van den Brandt, Ph. Lerch, L. Scandella, A. Zehnder, S. Mango, H. R. Ott, Martin Huber, Gene C. Hilton, John M. Martinis
We are developing small arrays of microcalorimeters based on transition edge sensors made with Mo/Au bilayers deposited on silicon nitride membranes and Au absorbers. The superconducting transition of the bilayers is adjusted to be around 130 mK with a

Microcalorimeter Energy Dispersive X-ray Spectrometer for Low Voltage Microanalysis

November 1, 2000
Author(s)
David A. Wollman, John M. Martinis, Sae Woo Nam, Gene C. Hilton, Kent D. Irwin, David A. Rudman, Norman F. Bergren, Steven Deiker, Martin Huber, Dale Newbury
Improved x-ray detector technology continues to be a critical metrological need in the semiconductor industry for contaminant particle analysis 1,2 and for high-spatial-resolution x-ray microanalysis using low-beam-voltage field-emission scanning electron

Microcalorimeter EDS: Benefits and Drawbacks

August 1, 2000
Author(s)
David A. Wollman, Dale Newbury, Sae Woo Nam, Gene C. Hilton, Kent D. Irwin, David A. Rudman, Steven Deiker, Norman F. Bergren, John M. Martinis
The commercial introduction of high-count-rate, near-room-temperature silicon drift detectors (presently available) and high-energy-resolution cryogenic microcalorimeters (forthcoming) is an exciting development in x-ray microanalysis, in which detector

Microcalorimeter Energy-Dispersive Spectrometry Using a Low Voltage Scanning Electron Microscope

July 1, 2000
Author(s)
David A. Wollman, Sae Woo Nam, Gene C. Hilton, Kent D. Irwin, Norman F. Bergren, David A. Rudman, John M. Martinis, Dale Newbury
We describe the current performance of the prototype microcalorimeter energy-dispersive spectrometer (5cal EDS) developed at NIST for X-ray microanalysis. We show that the low-energy 5cal EDS, designed for operation in the energy range 0.2-2 keV, offers

The Approaching Revolution in X-Ray Microanalysis: The Microcalorimeter Energy Dispersive Spectrometer

June 1, 2000
Author(s)
Dale E. Newbury, David A. Wollman, Gene C. Hilton, Kent D. Irwin, Norman F. Bergren, David A. Rudman, John M. Martinis
We have developed a high-resolution energy-dispersive x-ray spectrometer (EDS) based on cryogenic microcalorimeter x-ray detectors for use in x-ray microanalysis. With an energy resolution of 3 eV at 1.5 keV, count rate of {approximately} 500 s -1, and an

Application of Microcalorimeter EDS X-Ray Detectors to Particle Analysis

December 1, 1999
Author(s)
Alain C. Diebold, David A. Wollman, Gene C. Hilton, Kent D. Irwin, John M. Martinis, B. H. Liu
New microcalorimeter x-ray detector technology will revolutionize materials characterization. It is expected that the microcalorimeter EDS (energy dispersive spectrometer) will replace traditional lithium-drifted silicon semiconductor EDS due to its

Energy Dispersive X-Ray Spectrometry With the Transition Edge Sensor Microcalorimeter: A Revolutionary Advance in Materials Microanalysis

December 1, 1999
Author(s)
Dale E. Newbury, David A. Wollman, Kent D. Irwin, Gene C. Hilton, John M. Martinis
The NIST microcalorimeter energy dispersive x-ray spectrometer provides important advances in x-ray spectrometry. The high spectral resolution, approaching 2 eV for photon energies below 2 keV, the wide photon energy coverage, 250 eV to 10 keV, and the

Toward a 2-eV Microcalorimeter X-ray Spectrometer for Constellation-X

October 1, 1999
Author(s)
C. K. Stahle, Simon R. Bandler, T W. Barbee, J. Beeman, R.P. Brekosky, B. Cabrera, M. Cunningham, Steven Deiker, Enectali Figueroa-Feliciano, F. M. Finkbeiner, G R. Frank, K. C. Gendreau, E. E. Haller, Gene C. Hilton, Kent D. Irwin, R. L. Kelley, S. E. Labov, M. J. Li, N. Madden, John M. Martinis, D. McCammon, Sae Woo Nam, F. S. Porter, H. Schnopper, E. H. Silver, A. E. Szymkowiak, G. S. Tucker, A. Walker, David A. Wollman
Constellation-X is a cluster of identical observatories that together constitute a promising concept for a next-generation, high-throughput, high-resolution, astrophysical x-ray spectroscopy mission. The heart of the Constellation-X mission concept is a

Lowering the Limit of Detection in High Spatial Resolution Electron Beam Microanalysis With the Microcalorimeter Energy Dispersive X-Ray Spectrometer

June 1, 1999
Author(s)
Dale E. Newbury, David A. Wollman, Kent D. Irwin, Gene C. Hilton, John M. Martinis
Low-beam-energy x-ray microanalysis with the field-emission-gun scanning electron microscope suffers limitations due to physical factors of x-ray generation. Instrumental limitations are imposed by the poor resolution of the conventional semiconductor