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Search Publications by: Dylan Williams (Fed)

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Displaying 451 - 475 of 583

High Frequency Limitations of the JEDEC 123 Guideline

October 1, 1998
Author(s)
Dylan F. Williams
Abstract: This paper assesses certain systematic high frequency measurement errors inherent in the procedures described in the JEDEC 123 Guideline for Measurement of Electronic Package Inductance and Capacitance Model Parameters.

Accurate Characteristic Impedance Measurement on Silicon

June 1, 1998
Author(s)
Dylan F. Williams, Uwe Arz, Hartmut Grabinski
This paper presents a new method that accurately determines the characteristic impedance of planar transmission lines printed on lossy dielectrics even when contact-pad capacitance and conductance are large. We demonstrate the method on a coplanar

Comparison of SOLR and TRL Calibrations

June 1, 1998
Author(s)
Dave K. Walker, Dylan F. Williams
We examine a short-open-load-reciprocal scattering parameter calibration in both in-line and orthogonal probe configurations. We explore its standard definitions and verify its accuracy by comparing it to a multiline thru-reflect-line calibration.

In-Line Multiport Calibration Algorithm

June 1, 1998
Author(s)
Dylan F. Williams, Dave K. Walker
We present a multiport measurement procedure well suited to on-wafer measurement. It can correct multiport measurements with any conventional in-line calibration, including the thru-reflect-line calibration. We demonstrate the procedure in a four-port

Lumped-Element Impedance Standards

June 1, 1998
Author(s)
Dylan F. Williams, Dave K. Walker
We measure the electrical parameters of commercial lumped-element impedance standards manufactured for the calibration of on-wafer probing systems. The standard's impedance depends not only on the standard itself, but also on probe placement, probe

Metal-Insulator-Semiconductor Transmission Line Model

June 1, 1998
Author(s)
Dylan F. Williams
This paper investigates the one-dimensional metal-insulator-semiconductor transmission line. It develops closed-form expressions for equivalent-circuit parameters, compares them to exact calculations, and explores their limitations. It also investigates

Series-Resistor Calibration

December 1, 1997
Author(s)
Dylan F. Williams, Dave K. Walker
We develop a coplanar-waveguide probe-tip scattering parameter calibration based on a thru, a reflect, and an accurately modeled Series resistor. Comparison to a multiline Thru-Reflect-Line calibration verifies the accuracy of the method.

Quasi-TEM Model for Coplanar Waveguide on Silicon

October 1, 1997
Author(s)
Dylan F. Williams, Michael D. Janezic, A. Ralston
This paper compares a simple quasi-TEM model for coplanar waveguide fabricated on moderately doped silicon substrates to measurement. While the coplanar waveguide currents and magnetic fields are unaffected by the substrate, a simple capacitive model can

Characterization of Coplanar Waveguide on Epitaxial Layers

August 14, 1997
Author(s)
Dylan F. Williams, J. M. Belquin, Alain Spisser, Alain Cappy, G. Dambrine
We examine the effect of thin AlInAs/GaInAs epitaxial layers on the propagation of electrical signals in coplanar waveguide transmission lines fabricated on semi-insulating indium phosphide substrates. We show that argon isolation implants effectively

Embedded multiconductor transmission line characterization

June 8, 1997
Author(s)
Dylan F. Williams
This paper presents a measurement method that characterizes lossy printed multiconductor transmission lies embedded in transitions, connectors, or packages with significant electrical parasitics. We test the method on a pair of lossy coupled asymmetric
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