Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications by: Joseph Woicik (Fed)

Displaying 101 - 125 of 218

Strain-Induced Change in Local Structure and its Effect on the Ferromagnetic Properties of La0.5Sr0.5CoO3 Thin Films

November 3, 2008

Author(s)

Joseph C. Woicik, C. K. Xie, J. I. Budnick, W.A. Hines, B.O. Wells

Strained La0.5Sr0.5CoO3 films were epitaxially grown on SrTiO3 and LaAlO3 substrates by pulsed laser deposition. The Co-O bond lengths along in-plane and out-of-plane directions in thin films have been determined by high-resolution extended x-ray

Incipient amporphous-to-crystalline transition in HfO2 as a function of thickness scaling and anneal temperatures

January 15, 2008

Author(s)

Patrick S. Lysaght, Joseph Woicik, M A. Sahiner, Sanghoon Song, B -. Lee, Raj Jammy

X-Ray Topography to Characterize Surface Damage on CdZnTe Crystals

January 7, 2008

Author(s)

David R. Black, Joseph C. Woicik, Martine Duff, Douglas Hunter, Arnold Burger, Michael Groza

Synthetic CdZnTe or CZT crystals can be used for room temperature detection of ?-radiation. Structural/morphological heterogeneities within CZT, such as twinning, secondary phases (often referred to as inclusions or precipitates), and polycrystallinity can

Characterizing crystalline polymorph transitions in HfO2 by extended x-ray absorption fine-structure spectroscopy

December 17, 2007

Author(s)

Patrick S. Lysaght, Joseph Woicik, M A. Sahiner, B -. Lee, Raj Jammy

Pulsed Laser Deposition and Characterization of Hf-based High-k Dielectric Thin Films

October 26, 2007

Author(s)

Joseph C. Woicik, M A. Sahiner, Timothy Kurp, Jeffrey Serfass, Marc Aranguren

The continuous downward scaling of the complementary metal oxide semiconductor (CMOS) devices has enabled the Si-based semiconductor industry to meet the technological requirements such as high performance and low power consumption. However, the ever

Chemical Bonding and Many-Body Effects in Site-Specific X-ray Photoelectron Spectra of Corundum V2O3

October 1, 2007

Author(s)

Joseph C. Woicik, M Yekutiel, E J. Nelson, N Jacobson, P Pfalzer, L Kronik

Preliminary Hard X-ray Micro-spectroscopic investigations on Thin-Film Ta-and-W Based Diffusion Barriers for Copper Interconnect Technology

October 1, 2007

Author(s)

J Ablett, Joseph Woicik, Zs Tokei

Characterizing Crystalline Polymorph Transitions in HfO 2 by Extended X-Ray Absorption Fine-Structure Spectroscopy

September 20, 2007

Author(s)

Patrick S. Lysaght, Joseph Woicik, M A. Sahiner, B H. Lee, Raj Jammy

Detecting the spectroscopic signature of crystalline order in ultra-thin HfO2 gate dielectric films has been particularly challenging, yet essential to the explanation of atomic structure based mechanisms responsible for electrical performance. Atomic

Effects of Solution pH and Surface Chemistry on the Post-deposition Growth of Chemical Bath Deposited PbSe Nanocrystalline

September 1, 2007

Author(s)

Shaibai K. Sarkar, Shifi Kababya, Shimon Vega, Hagal Cohen, Joseph Woicik, A I. Frenkel, Gary Hodes

Ti K-XANES Analysis of the Cation Distribution in the CaTi 1-x Zr x O 3 Solid Solutions

August 14, 2007

Author(s)

Victor L. Krayzman, Igor Levin, Joseph C. Woicik

Abstract. The effects of local B-cation distribution and octahedral tilting on the pre-edge structure in the Ti X-ray absorption K-spectra of the CaTi1-xZrxO3 perovskite solid solutions were investigated. Experimental spectra for the disordered CaTi1

Spectroscopic Determination of Phase in Tetragonally Strained Ba 0.5 Sr 0.5 TiO 3 Films at Room Temperature

August 9, 2007

Author(s)

L M B Alldredge, Joseph Woicik, W Chang, S W. Kirchoefer, J M. Pond

Sputter-deposited Ba0.5Sr0.5TiO3 films on MgO(001) substrates with either in-plane (c a) tetragonal lattice distortions were characterized by polarization-dependent Ti K-edge x-ray absorption fine-structure (XAFS) spectroscopy and microwave dielectric

Synchrotron X-ray Based Characterization of ZdZnTe Crystals

August 1, 2007

Author(s)

Martine Duff, Douglas Hunter, Patterson Nuessle, David R. Black, H E. Burdette, Joseph Woicik, Arnold Burger, Michael Groza

Spectroscopic determination of phase in tetragonally strained Ba0.5Sr0.5TiO3 films at room temperture

July 30, 2007

Author(s)

L M. Alldredge, Joseph Woicik, W Chang, S W. Kirchoefer, J M. Pond

Was this page helpful?