Woicik, J.
, Gupta, J.
, Watkins, S.
and Crozier, E.
(1998),
Bond-Length Strain in Buried Ga<sub>1-x</sub>In<sub>x</sub>As Thin-Alloy Films Grown Coherently on InP(001), Applied Physics Letters
(Accessed April 23, 2024)
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Bond-Length Strain in Buried Ga1-xInxAs Thin-Alloy Films Grown Coherently on InP(001)
Published
Author(s)
, J A. Gupta, S P. Watkins, E D. Crozier
Abstract
The bond-length strain in a series of strained, buried Ga1-xInxAs thin-alloy films grown coherently on InP(001) has been determined by high-resolution extended x-ray absorption fine-structure measurements. Comparison with a random-cluster calculation demonstrates that the external strain imposed by pseudomorphic growth opposes the natural bond-length distortions due to alloying.Citation
Applied Physics Letters
Volume
73
Issue
9
Pub Type
Journals
Keywords
bond-length strain, high-resolution EXAFS, InP(001), macroscopic distortions, microscopic distortions, pseudomorphic films
Citation
Created August 16, 1998, Updated February 19, 2017