Woicik, J.
, Nelson, E.
and Pianetta, P.
(2000),
Direct Measurement of Valence-Charge Asymmetry by X-Ray Standing Waves, Physical Review Letters
(Accessed April 27, 2024)
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Direct Measurement of Valence-Charge Asymmetry by X-Ray Standing Waves
Published
Author(s)
, E Nelson, P Pianetta
Abstract
By detecting valence-photoelectron under condition of strong x-ray Bragg reflection, we have determined that a majority of GaAs valence charge resides on the anion sites of this heteropolar crystal, in quantitative agreement with the Ga-As bond polarity as calculated from the Hartree-Fock term values. In contrast, the valence charge distribution in GE is found to be symmetric. In both cases, the valence emission is found to be closely coupled to the atomic cores.Citation
Physical Review Letters
Volume
24
Issue
No. 4
Pub Type
Journals
Keywords
Bragg reflection, GaAs, valence-charge
Citation
Created January 1, 2000, Updated February 19, 2017