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Atomic-Resolution Study of Lattice Distortion of a Buried InGa1-xAs Monolayers in GaAs(001)



T L. Lee, M Pillai, Joseph Woicik, G Labanda, P Lyman, S A. Barnett, Michael Bedzyk


X-ray standing wave measurements were used to study the strain in one monolayer of pseudobinary alloy InxGa1-xAs buried in GaAs(001). The measured In position along the [001] direction, which exhibits a linear dependence on the In concentration x, supports the validity of macroscopic continuum elasticity theory at the one monolayer limit. A random-cluster calculation using a valence force field was performed to explain the origin of the vertical expansion of the strained layer observed by the experiment. With a cluster constructed for a buried monolayer of InxGa1-xAs in GaAs(001), the calculated As-In-As bond angle and the positions of the first nearest neighbor As atoms of In suggest that the linear dependence of the In height on the In concentration x is a combined result of the As-In-As bond bending and the local lattice relaxation at the GaAs/InxGa1-xAs interfaces. The calculated In-As and Ga-As bond lengths were found to depend weakly on the In concentration, consistent with an earlier calculation for the case of a thick InxGa1-xAs film on GaAs(001).
Physical Review B (Condensed Matter and Materials Physics)
No. 19


monolayer of GaAs/In<sub>x</sub>Ga<sub>1-x</sub>As, random-cluster calculation, x-ray standing wave (XSW)


Lee, T. , Pillai, M. , Woicik, J. , Labanda, G. , Lyman, P. , Barnett, S. and Bedzyk, M. (1999), Atomic-Resolution Study of Lattice Distortion of a Buried InGa<sub>1-x</sub>As Monolayers in GaAs(001), Physical Review B (Condensed Matter and Materials Physics) (Accessed May 26, 2024)


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Created October 31, 1999, Updated October 12, 2021