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Search Publications by: David S Simons (Assoc)

Displaying 126 - 148 of 148

Rapid-Thermal Annealing for Quantum-Well Heterostructure Device Fabrication

January 1, 1992

Author(s)

Daryl Myers, G. A. Vawter, G A. Jones, T. E. Zipperian, T. J. Drummond, I. J. Fritz, L. R. Dawson, T. M. Brennan, B. E. Hammons, A. K. Datye, David S. Simons, J. Comas

A SIMS Study of the Deuterium Distribution in SIMOX Buried Oxides, Extended Abstract

December 31, 1991

Author(s)

G. J. Campisi, Peter Roitman, David S. Simons, W. A. Krull

Evidence From SIMS of Doubly-Charged Boron Contamination During Singly-Charged Ion Implantation

December 31, 1991

Author(s)

David S. Simons, P Chi, Donald B. Novotny

Quantitative Analysis of Impurities in SIMOX Samples Using Secondary Ion Mass Spectrometry

December 31, 1991

Author(s)

P Chi, David S. Simons, Peter Roitman

Quantitative Depth Profiling of Aluminum-Implanted SIMOX by Use of Secondary Ion Mass Spectrometry

December 31, 1991

Author(s)

P Chi, David S. Simons, Peter Roitman, H. L. Hughes

Effect of Annealing Ambient on the Removal of Oxide Precipitates in High-Dose Oxygen-Implanted Silicon

December 2, 1991

Author(s)

S. Seraphin, S. J. Krause, Peter Roitman, David S. Simons, B. F. Cordts

Effect of Annealing Ambient on the Precipitation Processes in Oxygen-Implanted Silicon-on-Insulator Material, Extended Abstract

December 31, 1990

Author(s)

Peter Roitman, David S. Simons, S. Visitserngtrakul, C. O. Jung, S. J. Krause

Round-Robin Study of Implants in Si and SiO 2 by SIMS, RBS, and NAA

December 31, 1990

Author(s)

Peter Roitman, David S. Simons, P Chi, Richard M. Lindstrom, G. E. Lux, S. Baumann, S. W. Novak, R. G. Wilson, D. Farrington, J. Keenan, F. A. Stevie, J. L. Moore, R. B. Irwin, A. J. Filo, C. W. Magee, R. Alcorn, D. File

Unintentional Indium Incorporation in GaAs Grown by Molecular-Beam Epitaxy

November 26, 1990

Author(s)

Daryl Myers, L. R. Dawson, J. F. Klem, T. M. Brennan, David S. Simons, J. Comas, Joseph G. Pellegrino

Molecular Ion Imaging and Dynamic Secondary Ion Mass Spectrometry Analysis of Organic Compounds

January 1, 1990

Author(s)

John G. Gillen, David S. Simons, P. Williams

An ion microscope equipped with a resistive anode encoder imaging system has been used to acquire molecular secondary ion images, with lateral resolutions on the order of 1 μm, from several quaternary ammonium salts an amino acid, and a polynuclear

Artifacts Observed in Oxygen Profiles of SIMOX Samples by Secondary Ion Mass Spectrometry

December 31, 1988

Author(s)

P Chi, David S. Simons, Peter Roitman

Progress Toward a Semiconductor Depth-Profiling Standard

December 31, 1988

Author(s)

David S. Simons, P Chi, R. G. Downing, James R. Ehrstein, J. F. Knudsen