January 1, 1990
Author(s)
L Falicov, Daniel T. Pierce, S Bader, R Gronsky, K Hathaway, H Hopster, D Lambeth, S Parkin, G Prinz, M Salamon, Ivan K. Schuller, R Victora
A comprehensive review and state of the art in the field of surface, interface, and thin-film magnetism is presented. New growth techniques which produce atomically engineered novel material, special characterization techniques to measure meagnetic