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Scanning Electron Microscopy with Polarization Analysis (SEMPA): Studies of Surface Magnetic Microstructure

Published

Author(s)

M W. Hart, M Scheinfein, John Unguris, Daniel T. Pierce, Robert Celotta

Abstract

SEMPA provides a new and versatile means of imaging surface magnetic microstructure with high resolution. When a ferromagnetic sample is probed by the highly focussed electron beam of an SEM, secondary electrons are generated whose spin polarization is directly proportional to the magnetization in the region sampled by the beam. By measuring this spoin polarization, the direction and magnitude of the sample magnetization can be imaged with 10 nm spatial resolution. A review of the SEMPA technique and recent results will be presented.
Conference Dates
August 1, 1990
Conference Location
Pennington, NJ, USA
Conference Title
Symposium on Magnetic Materials, Processes and Devices

Citation

Hart, M. , Scheinfein, M. , Unguris, J. , Pierce, D. and Celotta, R. (1990), Scanning Electron Microscopy with Polarization Analysis (SEMPA): Studies of Surface Magnetic Microstructure, Symposium on Magnetic Materials, Processes and Devices, Pennington, NJ, USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=620368 (Accessed April 21, 2024)
Created December 31, 1989, Updated October 12, 2021