Surface, Interface and Thin-Film Magnetism

Published

January 1, 1990

Author(s)

L Falicov, Daniel T. Pierce, S Bader, R Gronsky, K Hathaway, H Hopster, D Lambeth, S Parkin, G Prinz, M Salamon, Ivan K. Schuller, R Victora

Abstract

A comprehensive review and state of the art in the field of surface, interface, and thin-film magnetism is presented. New growth techniques which produce atomically engineered novel material, special characterization techniques to measure meagnetic propertics of low-dimensionaal systems, and computational advances which allow large complex calculations have together stimulated the current activity in this field and opened new opportunities for research. The current status and issues in the area of material growth techniques and physical properties, characterization methods, and theoretical methods and ideas are reviewed. A fundamental understanding of surface, interface, and thin-film magnetism is of importance to many applications in magnetics technology, which is also surveyed. Questions of fundamental and technological interest that offer opportunities for exciting future research are identified.

Citation

Journal of Materials Research

Volume

5

Issue

6

Pub Type

Journals

Citation

Falicov, L. , Pierce, D. , Bader, S. , Gronsky, R. , Hathaway, K. , Hopster, H. , Lambeth, D. , Parkin, S. , Prinz, G. , Salamon, M. , Schuller, I. and Victora, R. (1990), Surface, Interface and Thin-Film Magnetism, Journal of Materials Research (Accessed October 13, 2025)