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Scanning Electron Microscopy with Polarization Analysis (SEMPA) Studies of Domains, Domain Walls and Magnetic Singularities at Surfaces and in Thin Films

Published

Author(s)

M Scheinfein, John Unguris, M Aeschlimann, Daniel T. Pierce, Robert Celotta

Abstract

Scanning Electron Microscopy with Polarization Analysis (SEMPA) is used to investigate the surface magnetic microstructure of domain walls in thin permalloy films and the domain structure of magneto-optic TbFeCo alloys. Domain wall measurements confirm the results of micromagnetic theory.
Citation
Journal of Magnetism and Magnetic Materials
Volume
93

Citation

Scheinfein, M. , Unguris, J. , Aeschlimann, M. , Pierce, D. and Celotta, R. (1991), Scanning Electron Microscopy with Polarization Analysis (SEMPA) Studies of Domains, Domain Walls and Magnetic Singularities at Surfaces and in Thin Films, Journal of Magnetism and Magnetic Materials (Accessed April 16, 2024)
Created December 31, 1990, Updated October 12, 2021