Scheinfein, M.
, Unguris, J.
, Kelley, M.
, Pierce, D.
and Celotta, R.
(1990),
Scanning Electron Microscopy With Polarization Analysis (SEMPA), Review of Scientific Instruments, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=620360
(Accessed December 5, 2024)