Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Scanning Electron Microscopy with Polarization Analysis: An Update

Published

Author(s)

John Unguris, M W. Hart, Robert Celotta, Daniel T. Pierce
Conference Dates
January 1, 1991
Conference Location
San Jose, CA, USA
Conference Title
49th Annual Meeting of the Electron Microscopy Society of America

Keywords

ELECTRON, MICROSCOPY

Citation

Unguris, J. , Hart, M. , Celotta, R. and Pierce, D. (1991), Scanning Electron Microscopy with Polarization Analysis: An Update, 49th Annual Meeting of the Electron Microscopy Society of America, San Jose, CA, USA (Accessed December 14, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created December 31, 1990, Updated October 12, 2021