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NIST Authors in Bold

Displaying 20126 - 20150 of 73751

Third-order antibunching from an imperfect single-photon source

February 4, 2014
Author(s)
Martin J. Stevens, Scott C. Glancy, Sae Woo Nam, Richard P. Mirin
We measure second- and third-order temporal coherences, g(2)(τ) and g(3)(τ1,τ2), of an optically excited single-photon source: an InGaAs quantum dot in a microcavity pedestal. Increasing the optical excitation power leads to an increase in the measured

Third-order antibunching from an imperfect single-photon source

February 4, 2014
Author(s)
Martin J. Stevens, Scott C. Glancy, Sae Woo Nam, Richard P. Mirin
We measure second- and third-order temporal coherences, g (2)(τ) and g (3)(τ1, τ2), of an optically excited single-photon source: an InGaAs quantum dot in a microcavity pedestal. Increasing the optical excitation power leads to an increase in the measured

A four-pixel single-photon pulse-position array fabricated from WSi superconducting nanowire single- photon detectors

February 3, 2014
Author(s)
Varun B. Verma, Robert D. Horansky, Francesco Marsili, Jeffrey Stern, Matthew Shaw, Adriana E. Lita, Richard P. Mirin, Sae Woo Nam
We demonstrate a scalable readout scheme for an infrared single-photon pulse-position camera consisting of WSi superconducting nanowire single-photon detectors. For an N × N array, only 2 × N wires are required to obtain the position of a detection event

Documentation for Reference Material (RM) 8820: A Versatile, Multipurpose Dimensional Metrology Calibration Standard for Scanned Particle Beam, Scanned Probe and Optical Microscopy

February 3, 2014
Author(s)
Michael T. Postek, Andras Vladar, Bin Ming, Bunday Benjamin
Reference Material (RM) 8820 is a multipurpose instrument calibration standard available from NIST. This is a dimensional standard initially developed to replace the out of stock RM 8090 used for X and Y scale calibrations of scanned particle beam

Estimation of uncertainty in application profiles

February 3, 2014
Author(s)
David W. Flater
Application profiling tools are the instruments used to measure software performance at the function and application levels. The most powerful measurement method available in application profiling tools today is sampling-based profiling, where a

Frequency Measurement

February 3, 2014
Author(s)
Michael A. Lombardi
An overview of frequency metrology, with emphasis on estimating accuracy and stability, oscillator types, and measurement instrumentation. It describes how to measure frequency and the statistics and terminology that are used to report the results. The

Head and Media Challenges for 3 Tb/in 2 Microwave Assisted Magnetic Recording

February 3, 2014
Author(s)
Thomas J. Silva, Justin M. Shaw, Hans T. Nembach, Mike Mallary, Kumar Srinivasan, Gerado Bertero, Dan Wolf, Christian Kaiser, Michael Chaplin, Mahendra Pakala, Leng Qunwen, Yiming Wang, Carl Elliot, Lui Francis
A specific design for Microwave Assisted Magnetic Recording (MAMR) at about 3Tb/in 2 (0.47 Tb/cm 2 or 4.7 Pb/m 2) is discussed in detail to highlight the challenges of MAMR and to contrast its requirements with conventional Perpendicular Magnetic Recording

IT Risks

February 3, 2014
Author(s)
Linda Wilbanks, D. Richard Kuhn, Wes Chou
Risk management is a common phrase when managing information, from the CISO to the programmer. We acknowledge that risk management is the identification, assessment and prioritization of risks and reflects how we manage uncertainty. These are some areas of

NIST Time and Frequency Bulletin

February 3, 2014
Author(s)
Petrina C. Potts
The Time and Frequency Bulletin provides information on performance of time scales and a variety of broadcasts (and related information) to users of the NIST services.

Real-Time Access Control Rule Fault Detection Using a Simulated Logic Circuit

February 3, 2014
Author(s)
Chung Tong Hu, Karen Scarfone
Access control (AC) policies can be implemented based on different AC models, which are fundamentally composed by semantically independent AC rules in expressions of privilege assignments described by attributes of subjects/attributes, actions, objects

The Importance of Entropy to Information Security

February 3, 2014
Author(s)
Apostol T. Vassilev, Timothy Hall
The strength of cryptographic keys is an active challenge in academic research and industrial practice. In this paper we discuss the entropy as fundamentally important concept for generating hard-to-guess, i.e., strong, cryptographic keys and outline the

Time Measurement

February 3, 2014
Author(s)
Michael A. Lombardi
An overview of time metrology, with emphasis on time interval measurements, and time synchronization. It covers the evolution of clocks and timekeeping, time scales, the fundamentals of time measurement, and the various time transfer technique used to

Ultra-Sensitive Chip-Based Photonic Temperature Sensor Using Ring Resonator Structures

February 3, 2014
Author(s)
Haitan Xu, Mohammad Hafezi, Jingyun Fan, Jacob Taylor, Gregory F. Strouse, Zeeshan Ahmed
Temperature is one of the most measured quantity in the world, second only to time. Recently there has been considerable interest in developing photonic temperature sensors to leverage advancements in frequency metrology. Here we show that Silicon based

Dynamic Spectrum Access: Current State of the Art and Future Challenges

February 2, 2014
Author(s)
Anirudha Sahoo, Michael R. Souryal
Dynamic Spectrum Access (DSA) is emerging as a promising technology to mitigate the spectrum scarcity caused by static frequency allocations. Despite the clear need for more efficient allocation, however, DSA faces a number of challenges, chief among them

A comparison of literature models for the oxidation of normal heptane

February 1, 2014
Author(s)
David A. Sheen, Wing Tsang
The development of detailed chemical kinetic models has proceeded unabated since the pioneering work of Dixon-Lewis and coworkers forty-five years ago. In that time, computational power has increased ten million-fold, and yet, we do not have a consensus on

A New NIST Primary Standardization of 18F

February 1, 2014
Author(s)
Ryan P. Fitzgerald, Brian E. Zimmerman, Denis E. Bergeron, Jeffrey T. Cessna, Leticia S. Pibida, Denise S. Moreira
A new primary standardization of 18F by NIST is reported. The standard is based on live-timed beta- gamma anticoincidence counting with confirmatory measurements by three other methods: (i) liquid scintillation (LS) counting using CIEMAT/NIST 3H efficiency
Displaying 20126 - 20150 of 73751
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