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Displaying 1751 - 1775 of 4224

An IEEE Standard Ontology for Robotics and Automation

October 12, 2012
Author(s)
Craig I. Schlenoff, Edson Prestes, Rajmohan Madhavan, Paulo Goncalvest, Howard Li, Stephen B. Balakirsky, Thomas R. Kramer, Emilio Miguelanez
In this article, we discuss a newly formed IEEE- RAS working group entitled Ontologies for Robotics and Automation (ORA). The goal of this working group is to develop a standard ontology and associated methodology for knowledge representation and reasoning

An Industrial Robotic Knowledge Representation for Kit Building Applications

October 12, 2012
Author(s)
Stephen B. Balakirsky, Zeid Kootbally, Craig I. Schlenoff, Thomas R. Kramer, Satyandra K. Gupta
The IEEE RAS Ontologies for Robotics and Automation Working Group is dedicated to developing a methodology for knowledge representation and reasoning in robotics and automation. As part of this working group, the Industrial Robots sub-group is tasked with

An Approach to Ontology-Based Intention Recognition Using State Representations

October 7, 2012
Author(s)
Craig I. Schlenoff, Sebti Foufou, Stephen B. Balakirsky
In this paper, we present initial thoughts on an approach to ontology/logic-based intention recognition based on the recognition, representation, and ordering of states. This is different than traditional approaches to intention recognition, which use

Optimization of Dispersion and Surface Pretreatment for Single GaN Nanowire Devices

September 28, 2012
Author(s)
Norman A. Sanford, Kristine A. Bertness, Andrew M. Herrero
The correlation of residual contamination with void formation at the contact/SiO2 interface for single GaN NW devices was investigated. The morphology at the metal/SiO2 interface was observed by removing the annealed Ni/Au films from the SiO2 with carbon

Factory Equipment Network Testing Framework: Concept, Requirements, and Architecture

September 17, 2012
Author(s)
James D. Gilsinn, Kang B. Lee, John L. Michaloski, Frederick M. Proctor, Yuyin Song
This document describes the purpose, concept, requirements, and architecture for the Factory Equipment Network Testing (FENT) Framework and the software to test equipment on real-time factory networks. Other documents contain more detailed information

Modeling Methodologies and Simulation for Dynamical Systems

August 27, 2012
Author(s)
Ion Matei, Conrad E. Bock
Computer-interpretable representations of system structure and behavior are at the center of designing today’s complex systems. Engineers create and review such representations using graphical modeling languages that support specification, analysis, design

Noncontact measurement of charge carrier lifetime and mobility in GaN nanowires

August 27, 2012
Author(s)
Christopher M. Dodson, Patrick Parkinson, Kristine A. Bertness, Hannah J. Joyce, Laura M. Herz, Norman Sanford, Michael B. Johnston
The first noncontact photoconductivity measurements of gallium nitride nanowires (NWs) are presented, revealing a high crystallographic and optoelectronic quality achieved by use of catalyst-free molecular beam epitaxy. In comparison with bulk material

Kinematic Modeling and Calibration of a Flexure Based Hexapod Nanopositioner

August 21, 2012
Author(s)
Hongliang Shi, Hai-Jun Su, Nicholas Dagalakis, John A. Kramar
This paper covers the kinematic modeling of a flexure-based, hexapod nanopositioner and a new method of calibration for this type of nanopositioner. This six degrees of freedom tri-stage nanopositioner can generate small displacement, high-resolution

CHARACTERIZING SUSTAINABILITY FOR MANUFACTURING PERFORMANCE ASSESSMENT

August 17, 2012
Author(s)
Mahesh Mani, Jatinder Madan, Jae H. Lee, Kevin W. Lyons, Satyandra K. Gupta
Manufacturing industries lack the measurement science and the needed information base to measure and effectively compare performances of manufacturing processes, resources and associated services with respect to sustainability. The current use of ad-hoc

Web-enabled Real-time Quality Feedback for Factory Systems using MTConnect

August 15, 2012
Author(s)
John L. Michaloski, Byeong Eon Lee, Frederick M. Proctor, Sid Venkatesh
Quality is a key element to success for any manufacturer, and the fundamental prerequisite for quality is measurement. In the discrete parts industry, quality is attained through inspection of parts but typically there is a long latency between machining
Displaying 1751 - 1775 of 4224
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