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NIST Authors in Bold

Displaying 176 - 200 of 1580

Millimeter-Wave Near-Field Measurements Using Coordinated Robotics

December 1, 2015
Author(s)
Joshua A. Gordon, David R. Novotny, Ronald C. Wittmann, Michael H. Francis, Miranda L. Butler, Jeffrey R. Guerrieri
The National Institute of Standards and Technology(NIST) recently developed a new robotic scanning system for performing near-field measurements at millimeter-wave (mm-wave)frequencies above 100 GHz, the configurable robotic millimeterwave antenna (CROMMA)

Deep-subwavelength Nanometric Image Reconstruction using Fourier Domain Optical Normalization

November 5, 2015
Author(s)
Jing Qin, Richard M. Silver, Bryan M. Barnes, Hui Zhou, Ronald G. Dixson, Mark Alexander Henn
Quantitative optical measurements of deep sub-wavelength, three-dimensional, nanometric structures with sensitivity to sub-nanometer details address an ubiquitous measurement challenge. A Fourier domain normalization approach is used in the Fourier optical

Millimeter-Wave Near-Field Measurements Using Coordinated Robotics

October 29, 2015
Author(s)
Joshua A. Gordon, David R. Novotny, Michael H. Francis, Ronald C. Wittmann, Alexandra Curtin, Miranda L. Butler, Jeffrey R. Guerrieri
The National Institute of Standards and Tech- nology (NIST) recently developed a new robotic scan- ning system for performing near-field measurements at millimeter-wave frequencies above 100 GHz, the CROMMA (Configurable Robotic Millimeter-Wave Antenna)

Antenna Measurement Implementations and Dynamic Positional Validation Using a Six Axis Robot

October 11, 2015
Author(s)
David R. Novotny, Josh Gordon, Michael H. Francis, Ronald C. Wittmann, Alexandra Curtin, Jeffrey R. Guerrieri
We have performed spherical and extrapolation scans of two antennas at 118 GHz using a commercial 6-axis robot. Unlike spherical scanning, linear extrapolations do not precisely conform to the native circular movement of the individual robot axes. To

Consensus Value Method to Compile On-Axis Gain Measurement Results

October 10, 2015
Author(s)
Jeffrey R. Guerrieri, Michael H. Francis, Ronald C. Wittmann
This paper shows that a consensus value method can be used to compile on-axis gain measurement data that have a large range of values and uncertainties. A variety of methods are used to analyze multiple data sets such as un-weighted averages, weighted

Generalized Probe-Position Compensation Methods for Near-Field Antenna Measurements

October 10, 2015
Author(s)
Michael H. Francis, Ronald C. Wittmann, Josh Gordon, David R. Novotny
The National Institute of Standards and Technology (NIST) has developed computationally efficient algorithms for probe location and polarization compensation in near- to far-field transformations for use when measurements are not made on the standard

Using the Amplitude Variation of a Reverberation Chamber Channel to Predict the Synchronization of a Wireless Digital Communication Test System

August 16, 2015
Author(s)
Ray R. Tanuhardja, Luis A. Gonzalez, Chih-Ming Wang, William F. Young, Kate Remley
This contribution discusses the use of a metric based on the amplitude variation of a channel in the signal bandwidth to predict whether or not a digital wireless communication test system receiver will be able to demodulate a test signal. This metric is

Interference and Coexistence of Wireless Systems in Critical Infrastructure

July 7, 2015
Author(s)
Galen H. Koepke, William F. Young, John M. Ladbury, Jason B. Coder
We examine interference and coexistence testing issues, test methods, and the need to update and develop new test methodologies related to the use of wireless devices in critical infrastructure systems. A case study on interference is presented along with

Amplitude and phase-resolved nano-spectral imaging of surface phonon polaritons in hexagonal boron nitride

June 9, 2015
Author(s)
Samuel Berweger, Shi Zhiwen, Hans A. Bechtel, Sun Yinghui, Zeng Bo, Jin Chenhao, Chang Henry, Michael C. Martin, Markus B. Raschke, Feng Wang
Phonon polaritons are quasiparticles resulting from strong coupling of photons with optical phonons. Excitation and control of these quasiparticles in 2D materials offer the opportunity to confine and transport light at the nanoscale. Here, we image the

Introduction to the Special Issue

May 1, 2015
Author(s)
Thomas M. Wallis, Goutam Chattopadhyay, Fabio Cocetti, Luca Pierantoni
In the inaugural editorial of these IEEE Transactions on Terahertz Science and Technology – September 2011, the editor-in-chief anticipated that the work published in this journal would push beyond topics that are familiar to the traditional RF and

Configurable Robotic Millimeter-Wave Antenna Facility

April 13, 2015
Author(s)
Jeffrey R. Guerrieri, Joshua A. Gordon, David R. Novotny, Michael H. Francis, Ronald C. Wittmann, Miranda L. Butler
This paper introduces the Configurable Robotic Millimeter-Wave Antenna (CROMMA) facility by the Antenna Metrology Lab at the National Institute of Standards and Technology (NIST). NIST set out to develop an antenna measurement facility that would be

Traceability for Microwave Power Measurements: Past, Present, and Future

April 13, 2015
Author(s)
Ronald A. Ginley
The need for traceable microwave power measurements for use in communications, defense, spectral line investigation, molecular particle signature identification, material property characterization and others is well established. Traceability for power

Measuring a Device's Susceptibility to LTE: Preliminary Approaches

March 15, 2015
Author(s)
Jason B. Coder, John M. Ladbury
Previous testing has shown that measuring a device’s susceptibility to a radiated, broadband signal can present a different set of challenges than those faced when testing with a narrow-band signal. Decisions ranging from choosing a measurement facility to

Widebend CTL cell to measure operating range of UHF RFID

March 5, 2015
Author(s)
Jehoon Yun, YongChae Jeong, David R. Novotny, Jeffrey R. Guerrieri
A wideband coupled transmission line (CTL) cell to measure the operating range of an UHF RFID (ORUR) is presented. Also, an ORUR test system is proposed to increase the isolation to more than 55 dB. It is shown that the ORUR measured by this proposed cell

Microwave Near-Field Imaging of Two-Dimensional Semiconductors

January 27, 2015
Author(s)
Samuel Berweger, Joel Weber, Jimmy J. Li, Jesus M. Velazquez, Adam Pieterick, Norman A. Sanford, Albert V. Davydov, Thomas Mitchell (Mitch) Wallis, Pavel Kabos
Optimizing new generations of 2D devices based on van der Waals materials will require techniques capable of measuring variations in electronic properties in situ and with nanometer spatial resolution. We perform scanning microwave microscopy (SMM) imaging
Displaying 176 - 200 of 1580
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