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Measuring a Device's Susceptibility to LTE: Preliminary Approaches

Published

Author(s)

Jason B. Coder, John M. Ladbury

Abstract

Previous testing has shown that measuring a device’s susceptibility to a radiated, broadband signal can present a different set of challenges than those faced when testing with a narrow-band signal. Decisions ranging from choosing a measurement facility to defining the measurement of the radiated electric field to defining when your DUT has failed can all have an impact on the final test results. In previous publications we’ve outlined these challenges via the use of experiments involving cable communications equipment and its susceptibility (or lack thereof) to radiated LTE signals. Here, we continue with those experiments, but shift the focus to proposing solutions to these questions. We discuss these solutions in a general sense, with hopes that they will encourage discussion in the community.
Proceedings Title
Proceedings of the 2015 IEEE International Symposium on Electromagnetic Compatibility and Signal Integrity
Conference Dates
March 15-21, 2015
Conference Location
Santa Clara, CA
Conference Title
2015 IEEE International Symposium on Electromagnetic Compatibility and Signal Integrity

Citation

Coder, J. and Ladbury, J. (2015), Measuring a Device's Susceptibility to LTE: Preliminary Approaches, Proceedings of the 2015 IEEE International Symposium on Electromagnetic Compatibility and Signal Integrity, Santa Clara, CA, [online], https://doi.org/10.1109/EMCSI.2015.7107660 (Accessed April 23, 2024)
Created March 15, 2015, Updated January 27, 2020