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Displaying 53376 - 53400 of 73697

Virtual Reality for Health Care: A Survey

December 1, 1997
Author(s)
J A. Moline
This report surveys the state of the art in applications of virtual environments and related technologies for health care. Applications of these technologies are being developed for health care in the following areas: surgical procedures (remote surgery or

Vitamin A

December 1, 1997
Author(s)
Katherine E. Sharpless, Jeanice M. Brown Thomas, C P. Turley, M A. Brewster

Vitamin E

December 1, 1997
Author(s)
Katherine E. Sharpless, Jeanice M. Brown Thomas, C P. Turley, M A. Brewster

Critically Assessed Tables of Atomic Spectroscopy Data

November 30, 1997
Author(s)
Wolfgang L. Wiese
The major NIST atomic spectroscopy data tables and the new NIST atomic spectra database (ASD) on the Internet are briefly reviewed. The need for critical assessments of atomic transition probabilities data is discussed, and the still unsatisfactory data

Nonlinear Dynamics Model for Chip Segmentation in Machining

November 30, 1997
Author(s)
Timothy J. Burns, Matthew A. Davies
We have developed a new model for chip formation in machining which includes a mechanism for thermomechanical feedback. This leads to an interpretation of metal cutting as a process which is similar in many ways to an open chemical reactor. As the cutting

Internet Electronic Mail

November 25, 1997
Author(s)
Barbara Guttman, Robert H. Bagwill, Elizabeth B. Lennon
This ITL Bulletin summarizes a chapter of the draft Internet Security Policy: A Technical Guide. It describes email protocols, organization email policy, email problems, and solutions.

Accelerometer Calibration at NBS/NIST, The Last Thirty Years.

November 22, 1997
Author(s)
Beverly F. Payne
This paper gives a short history of the development of the accelerometer calibration services at NBS/NIST from the mid-1950s to 1996. Many people were involved in the research and development that has led to the present calibration services. The references

SFRF: Spatial Frequency Response Function Estimation Program

November 10, 1997
Author(s)
Thomas A. Germer, Clara C. Asmail
Measurements of optical scatter are often employed in production line diagnostics for surface roughness of silicon wafers. However, the geometry of the optical scatter instrumentation lacks universal standardization, making it difficult to compare values
Displaying 53376 - 53400 of 73697
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