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Displaying 53351 - 53375 of 74045

Technical Digest, Symposium on Optical Fiber Measurements, 1998

January 1, 1998
Author(s)
Gordon W. Day, Douglas L. Franzen, Paul A. Williams
Polarization mode dispersion (PMD), multimode fiber parameters, fiber geometry and chromatic dispersion mapping in fibers are some of the measurement issues in this digest of papers presented at the tenth Symposium on Optical Fiber Measurements, held

Technical Directions of the NIST Precision Engineering Division: 1997-2001

January 1, 1998
Author(s)
Dennis A. Swyt, Howard H. Harary, Michael T. Postek, Richard M. Silver, Theodore V. Vorburger
This report, based on U.S. industry roadmaps and related National Institute of Standards and Technology studies, is a product of the process of strategic planning for the NIST Precision Engineering Division (PED) and presents the major technological trends

Testing Displacement-Measuring Interferometer Systems

January 1, 1998
Author(s)
Jack A. Stone Jr., Martin Schroeck, Michael T. Stocker
We have made a study of one method for testing displacement-measuring interferometer systems, a modified back-to-back comparison, that automatically compensates for changes in the optical path length between the two interferometers. Although this method

The Bose-Einstein condensate

January 1, 1998
Author(s)
Eric A. Cornell, C E. Wieman
In June 1995, our research group at the Joint Institute for Laboratory Astrophysics in Bolder, Colorado, succeeded in creating a miniscule but marvelous droplet. By cooling 2,000 rubidium atoms to a temperature less than 100 billionths of a degree above

The DOE2000 Materials MicroCharacterization Collaboratory

January 1, 1998
Author(s)
E Voelkl, K Alexander, J Mabon, M O'Keefe, Michael T. Postek, M Wright, N J. Zaluzec
The Materials Microcharacterization Collaboratory (MMC) was created last year as a pilot project within the U.S. Department of Energy''s DOE2000 program. The DOE2000 program has, as its main goals, to develop improved capabilities for solving DOE''s

The Molecular Measuring Machine

January 1, 1998
Author(s)
John A. Kramar, E Gilsinn, E Amatucci, C Villarrubia, E C. Teague, W Scire, William B. Penzes
To help meet the measurement needs of industries preparing to manufacture future generations of nanoelectronic devices and circuits, the National Institute of Standards and Technology (NIST) has designed and built an instrument¿called the Molecular
Displaying 53351 - 53375 of 74045
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