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NIST Authors in Bold

Displaying 52101 - 52125 of 73697

Summary Report of NIST/MSC Workshop on Traceability in Length

April 1, 1998
Author(s)
Dennis A. Swyt
The National Institute of Standards and Technology, in conjunction with the Measurement Science Conference, conducted an industry-needs workshop on February 4, 1998, on issues with U.S. manufacturing companies, particularly smaller ones, may have in

The EFFective Manager Tool for Software Developers

April 1, 1998
Author(s)
D Wallace, M L. Zimmerman
The collection and analysis of software error, fault, and failure data from many high integrity systems may yield reference data for matching development and assurance methods to characteristics of a specific system. Profiles derived from the data may help

Thermal-Response Time of Superconducting Transition-Edge Microcalorimeters

April 1, 1998
Author(s)
Kent D. Irwin, Gene C. Hilton, David A. Wollman, John M. Martinis
We investigate limits on the thermal-response time of supercondcuting transition-edge microcalorimeters. For operation at 0.1 K, we show that the lower limit on the response time of a superconducting transition-edge microcalorimeter is of order 1 5m due to

USAXS Studies of Silica Fume Additives in Cements and Concrete

April 1, 1998
Author(s)
Andrew J. Allen, Richard A. Livingston
Supplementary cementitious materials like silica fume, which are added to the cement mix and react with calcium ions in the pore solution, enhance the production of calcium-silicate-hydrate gel and modify the microstructure in other ways. By combining

Wavelengths and Oscillator Strengths for Space Astronomy

April 1, 1998
Author(s)
Craig J. Sansonetti, Joseph Reader
Over a period of more than a decade the Atomic Spectroscopy Group at NIST has carried out laboratory research to support the observing program of the Hubble Space Telescope (HST). Our Initial effort concerned the wavelength calibration of GHRS by means of

X-Ray Diffraction Topography of Sapphire for Windows and Domes

March 30, 1998
Author(s)
David R. Black
X-ray diffraction topography has been used as a nondestructive characterization tool to investigate single-crystal sapphire for window and dome applications. A variety of examples are shown that demonstrate the utility of x-ray diffraction imaging as a

Network Security Testing Using Mobile Agents

March 25, 1998
Author(s)
Athanasios T. Karygiannis
This paper describes a prototype security testing tool that is currently under development at NIST. This prototype tool uses autonomous mobile agents to perform distributed, fault-tolerant, and adaptive network security testing. The security testing

Pb-Distribution in a Five-Phase (Bi, Pd)-Sr-Ca-Cu-O Assemblage

March 12, 1998
Author(s)
Lawrence P. Cook, Winnie K. Wong-Ng
The partitioning of lead between phases in the nominal five-phase assemblage: (Pb,Bi) 3Sr 2Ca 2CuO x + (Ca,Sr) 2PbO 4 + (Bi,Pb) 2Sr 2CaCu 2O x + (Ca,Sr)O + Liquid has been investigated in an atmosphere of 7.5% O 2925% Ar. Samples were studied using a
Displaying 52101 - 52125 of 73697
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