Sulfer-K[beta] X-Ray Emission From Carbonyl Sulfide: Variations With Polarization and Excitation Energy at the S-K Threshold

Published

April 1, 1998

Author(s)

K E. Miyano, Uwe Arp, S H. Southworth, T E. Meehan, T R. Walsh, F P. Larkins

Abstract

Sulfur-K_[beta] x-ray emission spectra from carbonyl sulfide (OCS) have been measured with resonant excitation at the sulfur K absorption threshold and compared with results of [Δ]SCF and [Δ]DCI calculations. For excitation to the strong 4[pi] absorption resonance, a splitting of the main emission peak is interpreted in terms of influence of the 4[pi] electron on the final valence-hole states. The polarization selectivity of the emission spectrometer was used to distinguish emission polarized parallel versus perpendicular with respect to the polarization of the excitation radiation. The observed polarization dependence is consistent with the molecular symmetries of the calculated intermediate and final states.

Citation

Physical Review A (Atomic, Molecular and Optical Physics)

Volume

57

Issue

No. 4

Pub Type

Journals

Keywords

[Δ]SDCI calculations, carbonyl sulfide, molecular symmetries, polarization dependence, sulfur K_[beta] emission, x-ray emission

Citation

Miyano, K. , Arp, U. , Southworth, S. , Meehan, T. , Walsh, T. and Larkins, F. (1998), Sulfer-K_[beta] X-Ray Emission From Carbonyl Sulfide: Variations With Polarization and Excitation Energy at the S-K Threshold, Physical Review A (Atomic, Molecular and Optical Physics) (Accessed October 8, 2025)