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NIST List of Publications LP 103, National Semiconductor Metrology Program/Semiconductor Electronics Division, 1990-1999

April 12, 2000

Author(s)

A D. Settle-Raskin

The National Institute of Standards and Technology (NIST) began its first semiconductor metrology projects over 40 years ago, and continues that work in close cooperation with the semiconductor industry through a variety of research and services. Until

Full-Scale House Fire Experiment for InterFIRE VR, May 6, 1998. Report of Test.

April 10, 2000

Author(s)

Anthony D. Putorti Jr., Jay A. McElroy

A public/private partnership involving multiple federal agencies and private industry was assembled to develop a comprehensive fire investigation training tool. The partnership consisted of the following federal agencies: the Bureau of Alcohol, Tobacco and

Characterization of Electrical Linewidth Test Structures Patterned in (100) Silicon-on-Insulator for Use as CD Standards

April 6, 2000

Author(s)

Michael W. Cresswell, Richard A. Allen, Rathindra Ghoshtagore, Nadine Guillaume, Patrick J. Shea, Sarah C. Everist, Loren W. Linholm

Spin-Orbit Configuration Interaction Calculation of the Potential Energy Curves of Iodine Oxide

April 6, 2000

Author(s)

S Roszak, Morris Krauss, A B. Alekseyev, H P. Liebermann, R J. Buenker

An ab initio cofiguration interaction (CI) study including spin-orbit coupling is carried out for the ground and excited states of the IO radical by employing relativistic effective core potentials. The computed spectroscopic constants are in good

Temperature Measurements in Fires (NISTIR 6527)

April 5, 2000

Author(s)

William M. Pitts

Asia

April 4, 2000

Author(s)

Y Hasemi

Burning Item Sub-Models.

April 4, 2000

Author(s)

V Babrauskas

Electrical and Electronic Metrology: A Bibliography of NIST electricity Division's Publications -- March 1998

April 4, 2000

Author(s)

Ruth Ann Schmeit

This bibliography covers publications of the Electricity Division (and predecessor organizational units), Electronics and Electrical Engineering Laboratory, National institute of Standards and Technology, for the period of January 1968 through December

NIST List of Publications 94 Electrical and Electronic Metrology: A Bibliography of NIST Electricity Division's Publications -- March 2000

April 4, 2000

Author(s)

Ruth Ann Schmeit

This bibliography covers publications of the Electricity Division (and predecessor organizational units), Electronics and Electrical Engineering Laboratory, National Institute of Standards and Technology, for the period of January 1968 through December

Energy Price Indices and Discount Factors for Life-Cycle Cost Analysis - April 2000

April 3, 2000

Author(s)

S Fuller, A Boyles

This is the April 2000 edition of energy price indices and discount factors for performing life-cycle cost analyses of energy and water conservation and renewable energy projects in federal facilities. It will be effective from April 1, 2000, to March 31

Summary of the High Accuracy Aperture Measurement Capabilities at the National Institute of Standards and Technology

April 3, 2000

Author(s)

J B. Fowler, Robert D. Saunders, Albert C. Parr

The determination of the geometrical and the effective area for optical quality apertures is one of the fundamental sources of uncertainty in many radiometric and photometric measurements. The National Institute of Standards and Technology has developed

A Damper Control System for Preventing Reverse Airflow Through the Exhaust Damper of Variable-Air-Volume Air-Handling Units

April 1, 2000

Author(s)

J E. Seem, J House, George E. Kelly, C J. Klaassen

Traditional air-handling unit (AHU) control systems link the position of the exhaust, recirculation and outdoor air dampers. Laboratory tests of a variable-air-volume AHU using the traditional damper control approach revealed that outdoor air could enter

A Pulsed Laval Nozzle Apparatus With Laser Ionization Mass Spectroscopy for Direct Measurements of Rate Coefficients at Low Temperatures With Condensable Gases

April 1, 2000

Author(s)

S Lee, R J. Hoobler, S R. Leone

A pulsed Laval nozzle, low Mach number supersonic expanison kinetics apparatus has been constructed to study neutral-neutral kinetics by a rather general laser photolysis initiation and laser photoionization detection of the product species. This new

A Quantum Chemistry Study of the van der Waals Dimers of Benzene, Naphthalene, and Anthracene: Crossed (D 2d ) and Parallel-Displaced (C 2h ) Dimers of Very Similar Energies in the Linear Polyacenes

April 1, 2000

Author(s)

Carlos A. Gonzalez, E C. Lim

A quantum chemistry study of the ground-state structures and binding energies of the van der Waals dimers of benzene, naphthalene, and anthracene has been made at the MP2/6-31G and MP2/6-31+G levels of theory. For naphthalene and anthracene, the

A Recommendation for an Inspection Standard to Control Sub-Surface Damage in Single-Crystal Sapphire Components

April 1, 2000

Author(s)

David R. Black, Robert S. Polvani

A variety of characterization techniques have been investigated to study surface and subsurface damage in single-crystal sapphire. To characterize the damage in ground surfaces we found that dimpling was the most useful tool. Surfaces with damage

A Three-Phase Model for the Structure of Porous Thin Films Determined by X-Ray Reflectivity and Small Angle Neutron Scattering

April 1, 2000

Author(s)

Wen-Li Wu, Eric K. Lin, C Jin, J T. Wetzel

A methodology to characterize nanoporous thin films based on a novel combination of high resolution specular x-ray reflectivity and small angle neutron scattering has been advanced to accommodate heterogeneities within the material surrounding nanoscale

An Ab Initio Study of the Kinetics of the Reactions of Halomethanes With the Hydroxyl Radical. 1. CH 2 Br 2

April 1, 2000

Author(s)

F Louis, Carlos A. Gonzalez, Robert E. Huie, Michael J. Kurylo III

Ab initio calculations using the M ller-Plesset perturbation theory were carried out on the H-atom abstraction reaction from dibromomethane by hydroxyl radical attack. Geometry optimization and vibrational frequency calculations at the MP2 level were

Analytical Modeling of Oxide Thickness Effects on Residual Stresses in Thermal Barrier Coatings

April 1, 2000

Author(s)

C H. Hsueh, Lin-Sien H. Lum

The effects of the thickness of the thermally grown oxide on residual thermal stresses in a plasma-sprayed thermal barrier coating were numerically simulated in Part I. In the tip region of a convex asperity, the residual stress normal to the interface,

Application of GRID to Foreign Atom Localization in Single Crystals

April 1, 2000

Author(s)

A Karmann, W Wesch, B Weber, H G. Borner, M Jentschel

Calculable Coaxial Resistors for Precision Measurements

April 1, 2000

Author(s)

Randolph E. Elmquist

Calculating Characteristics of Non-collinear Phase-Matching in Uniaxial and Biaxial Crystals

April 1, 2000

Author(s)

N Boeuf, D A. Branning, I Chaperot, E Dauler, S Guerin, G Jaeger, Andreas Muller, Alan L. Migdall

A method of calculating the characteristics of phase-matching in both uniaxial and biaxial crystals is presented. Although significant work has been done to characterize the collinear case of phase-matching and to present many of its applications, the non

Calculation of Ion Energy Distributions from Radio Frequency Plasmas Using a Simplified Kinetic Approach

April 1, 2000

Author(s)

Martin Misakian, Yicheng Wang

Using an elementary kinetic approach, a procedure is described for calculating ion energy distributions (IEDs) from radio frequency (rf) plasmas. The calculated distributions, which are in the form of histograms, are used to fit experimental argon and CF 3

Calibrated Thermal Microscopy of the Tool-Chip Interface in Machining

April 1, 2000

Author(s)

Michael Kennedy, Matthew A. Davies, Howard W. Yoon, Timothy J. Burns

A critical parameter in predicting tool wear during machining and in accurate computer simulations of machining is the spatially-resolved temperature at the tool-chip interface. We describe the development and the calibration of a nearly diffraction

Calibration of Lightpipe Radiation Thermometers in a RTP Tool at 1000 C

April 1, 2000

Author(s)

Kenneth G. Kreider, D P. DeWitt, Christopher W. Meyer, Vincent P. Scheuerman

We are developing an instrumented calibration wafer for radiometric temperature measurements in rapid thermal processing (RTP) that uses Pt/Pd wire and noble metal thin-film thermocouples that are welded to thin-film pads of Pt. The Pt/Pd wire

CEMHYD3D: A Three-Dimensional Cement Hydration and Microstructure Development Modelling Package. Version 2.0

April 1, 2000

Author(s)

Dale P. Bentz

This user's manual provides updated documentation and computer program listings for version 2.0 of the three-dimensional cement hydration and microstructure development model (CEMHYD3D) developed at the National Institute of Standards and Technology

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