Bailey, W.
, Wang, S.
and Tsymbal, E.
(2000),
Electronic scattering from Co/Cu interfaces: In situ measurement, comparison with microstructure, and failure of semiclassical free-electron models, Journal of Applied Physics
(Accessed December 15, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Electronic scattering from Co/Cu interfaces: In situ measurement, comparison with microstructure, and failure of semiclassical free-electron models
Published
Author(s)
William E. Bailey, S X. Wang, E Y. Tsymbal
Citation
Journal of Applied Physics
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created April 30, 2000, Updated October 12, 2021