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Electronic scattering from Co/Cu interfaces: In situ measurement, comparison with microstructure, and failure of semiclassical free-electron models

Published

Author(s)

William E. Bailey, S X. Wang, E Y. Tsymbal
Citation
Journal of Applied Physics

Citation

Bailey, W. , Wang, S. and Tsymbal, E. (2000), Electronic scattering from Co/Cu interfaces: In situ measurement, comparison with microstructure, and failure of semiclassical free-electron models, Journal of Applied Physics (Accessed October 10, 2024)

Issues

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Created April 30, 2000, Updated October 12, 2021