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Displaying 47326 - 47350 of 74164

Emission-Line Intensity Ratios in FeXVII Observed with a Microcalorimeter on an Electron Beam Ion Trap

December 1, 2000
Author(s)
J M. Laming, I Kink, E Takacs, James V. Porto, John D. Gillaspy, E Silver, H. Schnopper, Simon R. Bandler, N Brickhouse, S Murray, M Barbera, A K. Bhatia, G. A. Doschek, N. Madden, D Landis, J. Beeman, E. E. Haller
We report new observations of emission line intensity ratios of Fe XVII under controlled experimental conditions, using the National Institute of Standards and Technology electron beam ion trap (EBIT) with a microcalorimeter detector. . . .Both R-matrix

Enthalpies of Formation in the Pseudobinary LaAl x Ni 5-x System

December 1, 2000
Author(s)
R Klein, P A. O'Hare, I Jacob
The pseudobinary system LaAl xNi 5-x has a composition limit at x {nearly equal to} 1.3. The standard molar enthalpies of formation fHm (298.15 K) were determined by solution calorimetry in HCl (c = 6 mol dm -3) to be -(129.4 +6.5) kJ mol -1 for x = 0.25;

Epitaxial Si-Based Tunnel Diodes

December 1, 2000
Author(s)
P E. Thompson, K D. Hobart, M E. Twigg, S L. Rommel, N Jin, P R. Berger, R Lake, A C. Seabaugh, P Chi, David S. Simons
Tunneling devices in combination with transistors offer a way to extend the performance of existing technologies by increasing circuit speed and decreasing static power dissipation. We have investigated Si-based tunnel diodes grown using molecular beam

First Steps Towards Small Arrays of Mo/Au Microcalorimeters

December 1, 2000
Author(s)
J. Olsen, E. C. Kirk, K. Thomsen, B. van den Brandt, Ph. Lerch, L. Scandella, A. Zehnder, S. Mango, H. R. Ott, Martin Huber, Gene C. Hilton, John M. Martinis
We are developing small arrays of microcalorimeters based on transition edge sensors made with Mo/Au bilayers deposited on silicon nitride membranes and Au absorbers. The superconducting transition of the bilayers is adjusted to be around 130 mK with a

Inelastic Neutron Scattering From Filled Elastomers

December 1, 2000
Author(s)
A Nakatani, R Ivkov, P Papanek, H Yang, M Gerspacher
Inelastic neutron scattering experiments such as filter analyzer spectroscopy and time-of flight spectroscopy are powerful techniques for evaluating local molecular dynamics. These methods do not require isotopic labeling of the sample and therefore have a

Inhibitor Rankings for Alkane Combustion

December 1, 2000
Author(s)
Valeri I. Babushok, Wing Tsang
The effect of hydrocarbon fuel type on the ranking of inhibitor effectiveness has been investigated through computer simulations. The approach involves carrying out sensitivity analysis on the detailed kinetics of the combustion of C 1-C 4 hydrocarbons. It

Issues in Purchasing and Maintaining Intrinsic Standards

December 1, 2000
Author(s)
R B. Pettit, K Jaeger, Charles D. Ehrlich
Intrinsic standards offer many advantages over conventional artifact standards, including, in many cases, a very low uncertainty of measurement and no need for periodic re-calibration. Because of the recent increased interest in intrinsic standards, NCSL

Knowledge-Based Systems and Computational Tools for Concrete - Computer Integrated Knowledge Systems Combine Databases, Models, and Computing Tools to Address the Complex Nature of Concrete

December 1, 2000
Author(s)
Edward J. Garboczi, Dale P. Bentz, G J. Frohnsdorff
Within the Building Materials Division at the National Institute of Standards and Technology (NIST), the Hypercon Partnership for High Performance Concrete Technology [(PHPCT) http://ciks.cbt.nist.gov/phpct/] program is working to develop the materials

Lumped-Element Models for On-Wafer Calibration

December 1, 2000
Author(s)
Dave K. Walker, Raian K. Kaiser, Dylan F. Williams, Kevin J. Coakley
We examine electrical models for lumped-element impedance standards used in on-wafer network-analyzer calibrations. We illustrate the advantages of using models that are complicated enough to replicate the actual electrical behavior of the lumped standards

Mismatch Corrections for Electro-Optic Sampling Systems

December 1, 2000
Author(s)
Dylan F. Williams, Paul D. Hale, Tracy S. Clement, Juanita M. Morgan
We develop and apply frequency-domain mismatch corrections to a temporal electro-optic sampling system. We use these corrections to characterize the magnitude and phase of electrical sources that are physically far removed from the point at which the

New Primary Standard for Specular Gloss Measurements

December 1, 2000
Author(s)
Maria E. Nadal, E A. Thompson
The measurement of specular gloss consists in comparing the luminous reflectance from a specimen to that from a calibrated gloss standard, under the same geometric conditions. The standard recommendations for the gloss standard are discussed. A new primary

NIST and Strategic Standardization

December 1, 2000
Author(s)
JoAnne R. Overman
NIST's Office of Standards Services coordinates Federal government standards activities under the National Technology Transfer and Advancement Act and chairs the Interagency Committee on Standards Policy. Through these and other Office activities, NIST

NIST Centennial Celebration - Crystallographic Highlights

December 1, 2000
Author(s)
Winnie K. Wong-Ng, Alan D. Mighell, Gabrielle G. Long, Leonid A. Bendersky, Vicky L. Karen, J D. Barnes, G L. Gilliland, T Gallagher, Terrell A. Vanderah, R G. Munro, Paul E. Stutzman, H F. McMurdie, S Block, Gasper J. Piermarini, Robert S. Roth, Antonio Santoro, Curt W. Reimann, C R. Hubbard, John W. Cahn, E Prince, D R. Lide, H Ondik, Lawrence P. Cook, T Siegrist, G DeTitta, L Finger, H Evans, E Gabe, G Enright, J T. Armstrong, M Levenson, Laurence C. Chow, Shozo Takagi, M Mathew, Jeffrey W. Lynn, H S. Peiser
NIST has a long history of crystallographic research, and has made significant contributions to the advancement of the fields of crystallography, biology, and materials science. The articles are contributed by scientists from various divisions at NIST, and
Displaying 47326 - 47350 of 74164
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