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Displaying 47001 - 47025 of 73929

Visible Fluoride Fiber Lasers

January 1, 2001
Author(s)
David S. Funk, J. G. Eden
The advent of low-loss fluoride fibers has led to the demonstration of numerous room-temperature lasers based on rare-earth transitions at wavelengths ranging from 0.38 to 3.45 υm. Fluoride fiber lasers are of interest because they provide a means of

Wavelength References for Wavelength Division Multiplexing

January 1, 2001
Author(s)
Sarah L. Gilbert, Tasshi Dennis, William C. Swann
We describe NIST research on wavelength standards for optical fiber communications. We have developed transfer standrds that can be used to calibrate instruments in the 1510-1560 nm region and a investigating references for other regions.

Wavelength standards for optical communications

January 1, 2001
Author(s)
Sarah L. Gilbert, William C. Swann, Tasshi Dennis
We review wavelength accuracy and calibration issues for wavelength division multiplexed (WDM) optical fiber communication and describe our work on wavelength calibration references. We have developed wavelength references for National Institute of

Window-Based Applications of TRC Databases: Structure and Internet Distribution

January 1, 2001
Author(s)
X. Yan, Qian Dong, Michael D. Frenkel, K. R. Hall
Thermophysical and thermochemical property data on organic compounds provide vital background information for scientific and engineering communities in both academic and industrial environments. The Thermodynamics Research Center (TRC) has collected an

Workshop on Temperature Measurement of Semiconductor Wafers Using Thermocouples

January 1, 2001
Author(s)
Kenneth G. Kreider, D P. DeWitt, Benjamin K. Tsai, B Lojek
Temperature measurement is an important parameter in most semiconductor processes. These measurements are necessary in temperature ranges as low as below 0 C in some plasma etch processes, to near room temperature for soft bakes of resists, to 500 C for
Displaying 47001 - 47025 of 73929
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