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NIST Authors in Bold

Displaying 46876 - 46900 of 73697

Inelastic Neutron Scattering From Filled Elastomers

December 1, 2000
Author(s)
A Nakatani, R Ivkov, P Papanek, H Yang, M Gerspacher
Inelastic neutron scattering experiments such as filter analyzer spectroscopy and time-of flight spectroscopy are powerful techniques for evaluating local molecular dynamics. These methods do not require isotopic labeling of the sample and therefore have a

Inhibitor Rankings for Alkane Combustion

December 1, 2000
Author(s)
Valeri I. Babushok, Wing Tsang
The effect of hydrocarbon fuel type on the ranking of inhibitor effectiveness has been investigated through computer simulations. The approach involves carrying out sensitivity analysis on the detailed kinetics of the combustion of C 1-C 4 hydrocarbons. It

Issues in Purchasing and Maintaining Intrinsic Standards

December 1, 2000
Author(s)
R B. Pettit, K Jaeger, Charles D. Ehrlich
Intrinsic standards offer many advantages over conventional artifact standards, including, in many cases, a very low uncertainty of measurement and no need for periodic re-calibration. Because of the recent increased interest in intrinsic standards, NCSL

Knowledge-Based Systems and Computational Tools for Concrete - Computer Integrated Knowledge Systems Combine Databases, Models, and Computing Tools to Address the Complex Nature of Concrete

December 1, 2000
Author(s)
Edward J. Garboczi, Dale P. Bentz, G J. Frohnsdorff
Within the Building Materials Division at the National Institute of Standards and Technology (NIST), the Hypercon Partnership for High Performance Concrete Technology [(PHPCT) http://ciks.cbt.nist.gov/phpct/] program is working to develop the materials

Lumped-Element Models for On-Wafer Calibration

December 1, 2000
Author(s)
Dave K. Walker, Raian K. Kaiser, Dylan F. Williams, Kevin J. Coakley
We examine electrical models for lumped-element impedance standards used in on-wafer network-analyzer calibrations. We illustrate the advantages of using models that are complicated enough to replicate the actual electrical behavior of the lumped standards

Mismatch Corrections for Electro-Optic Sampling Systems

December 1, 2000
Author(s)
Dylan F. Williams, Paul D. Hale, Tracy S. Clement, Juanita M. Morgan
We develop and apply frequency-domain mismatch corrections to a temporal electro-optic sampling system. We use these corrections to characterize the magnitude and phase of electrical sources that are physically far removed from the point at which the

New Primary Standard for Specular Gloss Measurements

December 1, 2000
Author(s)
Maria E. Nadal, E A. Thompson
The measurement of specular gloss consists in comparing the luminous reflectance from a specimen to that from a calibrated gloss standard, under the same geometric conditions. The standard recommendations for the gloss standard are discussed. A new primary

NIST and Strategic Standardization

December 1, 2000
Author(s)
JoAnne R. Overman
NIST's Office of Standards Services coordinates Federal government standards activities under the National Technology Transfer and Advancement Act and chairs the Interagency Committee on Standards Policy. Through these and other Office activities, NIST

NIST Centennial Celebration - Crystallographic Highlights

December 1, 2000
Author(s)
Winnie K. Wong-Ng, Alan D. Mighell, Gabrielle G. Long, Leonid A. Bendersky, Vicky L. Karen, J D. Barnes, G L. Gilliland, T Gallagher, Terrell A. Vanderah, R G. Munro, Paul E. Stutzman, H F. McMurdie, S Block, Gasper J. Piermarini, Robert S. Roth, Antonio Santoro, Curt W. Reimann, C R. Hubbard, John W. Cahn, E Prince, D R. Lide, H Ondik, Lawrence P. Cook, T Siegrist, G DeTitta, L Finger, H Evans, E Gabe, G Enright, J T. Armstrong, M Levenson, Laurence C. Chow, Shozo Takagi, M Mathew, Jeffrey W. Lynn, H S. Peiser
NIST has a long history of crystallographic research, and has made significant contributions to the advancement of the fields of crystallography, biology, and materials science. The articles are contributed by scientists from various divisions at NIST, and

Non-collinear Exchange Coupling in Fe/Mn/Fe(001): Insight from Scanning Tunneling Microscopy

December 1, 2000
Author(s)
Daniel T. Pierce, Angela Davies, Joseph A. Stroscio, D Tulchinsky, John Unguris, Robert Celotta
The film growth and morphology of epitaxial Mn films grown on Fe(001) single crystal whiskers measured with scanning tunneling microscopy (STM) provides insight into the mechanism of interlayer exchange coupling in Fe/Mn/Fe(001) trilayers. The proximity

Optical Frequency Measurement: 40 Years of Technology Revolutions

December 1, 2000
Author(s)
J L. Hall
The past forty years have witnessed spectacular progress in precision measurements, beginning with the first coherent optical source, the HeNeCW laser, demonstrated in late 1960 by A. Javan. B. Bennett, and D. Herriott, at Bell Laboratories. Almost

Optimization of an Annular Jet Commercial Gas-Metal Atomizer

December 1, 2000
Author(s)
Stephen D. Ridder, Aaron N. Johnson, Pedro I. Espina, Frank S. Biancaniello, G J. DelCorso
The performance of a commercial gas-metal atomizer was studied using a number of previously published research techniques. initially the flow was visualized using schlieren photography to determine the location of important flow features (e.g., shock waves

Preparation and Certification of K-411 Glass Microspheres

December 1, 2000
Author(s)
Ryna B. Marinenko, S V. Roberson, J S. Small, Barbara B. Thorne, Douglas H. Blackburn, D Kauffman, Stefan D. Leigh
The production and characterization of NBS K-411 glass microspheres in the 3-40 um range for certification as a NIST Standard Reference Material (SRM) are described. EDS quantitative analysis and heterogeneity evaluations of the microspheres were made with

Radiated Power Measurements in Reverberation Chambers

December 1, 2000
Author(s)
Galen H. Koepke, John M. Ladbury
The electromagnetic reverberation chamber is widely used as a test facility to generate complex fields for interference and compatibility measurements. The chamber is also effective as a method to quantify the total radiated power from an emitter
Displaying 46876 - 46900 of 73697
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