NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 45226 - 45250 of 73697

High Temperature Characteristics of 5kV, 20 A 4H-SiC PiN Rectifiers

June 7, 2001
Author(s)
Ranbir Singh, Allen R. Hefner Jr., David W. Berning, M. Palmer
This paper reports in detail, the design, a manufactuable fabrication process, and high temperature characteristics of a 4H-SiC rectifier with a 5 kV, 20 A rating. A highly doped p-type epitaxial Anode layer and junction termination extension (JTE) were

Interferometric Figure Metrology; Enabling In-House Traceability

June 6, 2001
Author(s)
Christopher J. Evans, Angela Davies, Tony L. Schmitz, R E. Parks
The basic goal of the Advanced Optics Metrology program at NIST''s Manufacturing Engineering Laboratory is to help industry ensure that their measurement results of optical figure and wavefront are traceable. This paper underscores the importance of

First Workshop on Wireless Sensing

June 4, 2001
Author(s)
Kang B. Lee, James D. Gilsinn, Richard D. Schneeman, Hui-Min Huang
The First Wireless Sensing Workshop was held on June 4, 2001, at the Sensors Expo/Conference at the Rosemont Convention Center in Chicago, IL. The National Institute of Standards and Technology (NIST), SENSORS magazine, Sensors Conference, and Institute of

The Cultural Context of Web Genres: Content vs. Style

June 4, 2001
Author(s)
A Badre, Sharon J. Laskowski
The question we raise here is whether what is culturally established for a given genre in the brick and mortar world applies equally on the World Wide Web. Can we effectively use the styles of one genre to design the site of another genre? Are we wedded to

100 Years of Optical Science and Metrology at NIST

June 1, 2001
Author(s)
William R. Ott
The National Bureau of Standards (NBS) was formed by Congress 100 years ago. The early Bureau was a small organization, founded at the beginning of the age of electricity to promote industrial productivity, commerce, technological progress, and the quality

100 Years of Photometry and Radiometry Harnessing Light

June 1, 2001
Author(s)
Jonathan E. Hardis
Measurement of light is an old subject, though the past 100 years have seen significant advances. 100 years ago, photometry the art and science of measuring light as it is preceived by people had the greatest technological importance. Even today, SI (the

A Combined Process/Resource-oriented Approach to Shopfloor Simulation

June 1, 2001
Author(s)
Hyunbo Cho, Albert W. Jones, P Y. Jang
Manufacturing simulation tools are used frequently to analyze proposed planning, scheduling, and control decisions that attempt to optimize some performance measure(s) for the shop. These shops exhibit a dynamic and complicated evolution caused by the

A Framework for Managing Faults and Attacks in All-Optical Transport Networks

June 1, 2001
Author(s)
J K. Patel, S U. Kim, David H. Su, M Subramaniam, H A. Choi
ult and attack survivability in all-optical transport networks (AOTNs) require new approaches because of unique transmission characteristics. Specifically, fiber non-linearities and network transparency to transmitted signal types may make the network

A Model for the Flow of Design Information in OpenADE

June 1, 2001
Author(s)
Steven Shooter, Walid Keirouz, Simon Szykman, Steven J. Fenves
This working document describes OpenADE's agent-based architecture. The goal for developing this architecture is to support information exchange and interoperability between design agents throughout the life-cycle of an artifact. The architecture itself is

A Model of Chemical Mechanical Polishing

June 1, 2001
Author(s)
E W. Paul
A model of chemical mechanical modeling (CMP) is presented which quantitatively correlates the polishing rate with the slurry concentrations of both chemicals and abrasives. The model predicts that as the concentration of either chemicals or abrasives is

A New Type of Frequency Chain and its Application to Fundamental Frequency Metrology

June 1, 2001
Author(s)
Thomas Udem, J Reichert, R Holzwarth, Scott Diddams, D J. Jones, Jun Ye, S T. Cundiff, T W. Hansch, John L. Hall
A suitable femtosecond (fs) laser system can provide a broad band comb of stable optical frequencies and thus can serve as an rf/opticalcoherent link. In this way we have performed a direct comparison of the 1 S - 2S transition in atomic hydrogen at 121 nm

AlGaN Schottky Diodes for Short-Wavelength UV Applications

June 1, 2001
Author(s)
P P. Chow, J J. Klaassen, Robert E. Vest, J M. VanHove, A Wowchak, C Polley
High performance ultraviolet (UV) detectors have been fabricated using plasma-enhanced molecular beam epitaxy (MBE). The realized AlGaN Schottky detectors exhibit high responsivity, sharp spectral cutoff and high shunt resistance of several giga-ohns for 0

Analysis of Dimensional Metrology Standards

June 1, 2001
Author(s)
Thomas R. Kramer, John Evans, Simon P. Frechette, John A. Horst, Hui-Min Huang, Elena R. Messina, Frederick M. Proctor, William G. Rippey, Harry A. Scott, Theodore V. Vorburger, Albert J. Wavering
This is an analysis of standards related to dimensional metrology, with recommendations regarding standards development. The analysis focuses on the degree to which existing and developing standards provide a complete set of non-overlapping specifications

Analytic Sampling-Circuit Model

June 1, 2001
Author(s)
Dylan F. Williams, Catherine A. Remley
Abstract: We develop analytic expressions for the impulse response and kickout pulses of a simple sampling circuit that incorporate the nonlinear junction capacitance of the sampling diode. We examine the effects of both the time-varying junction

Analyzing Load History Dependence of Fracture in Structural Adhesives

June 1, 2001
Author(s)
Donald L. Hunston
The most common toughening mechanisms in structural adhesives are viscoelastic processes which means that the fracture enrgies for bulk adhesive specimens and bonded joints will vary with loading history. Although this is well known, relaviely few studies

Architectures in an XML World

June 1, 2001
Author(s)
Joshua Lubell
XML[Extensible Markup Language] developers today have at their disposal a variety of tools for achieving schema reuse. An often-overlooked reuse method is the specification of architectures for creating and processing data. Experience with APEX, an
Displaying 45226 - 45250 of 73697
Was this page helpful?