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Analysis of Dimensional Metrology Standards

Published

Author(s)

Thomas R. Kramer, John Evans, Simon P. Frechette, John A. Horst, Hui-Min Huang, Elena R. Messina, Frederick M. Proctor, William G. Rippey, Harry A. Scott, Theodore V. Vorburger, Albert J. Wavering

Abstract

This is an analysis of standards related to dimensional metrology, with recommendations regarding standards development. The analysis focuses on the degree to which existing and developing standards provide a complete set of non-overlapping specifications for information needed to perform dimensional metrology. The analysis identifies four major software systems and their interfaces. It also identifies 15 dimensional metrology activities, each of which is expected to correspond to a software module. The major systems are made up of sets of modules. Twenty-two application programming interfaces and data formats for dimensional metrology are identified and discussed. The analysis also discusses issues regarding languages in which standards may be written.
Citation
NIST Interagency/Internal Report (NISTIR) - 6847
Report Number
6847

Keywords

dimensional, DMIS, inspection, metrology, NIST, numerical control, process-planning, standard

Citation

Kramer, T. , Evans, J. , Frechette, S. , Horst, J. , Huang, H. , Messina, E. , Proctor, F. , Rippey, W. , Scott, H. , Vorburger, T. and Wavering, A. (2001), Analysis of Dimensional Metrology Standards, NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=821714 (Accessed April 17, 2024)
Created June 1, 2001, Updated February 19, 2017